{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,14]],"date-time":"2026-04-14T16:20:24Z","timestamp":1776183624146,"version":"3.50.1"},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/irps.2019.8720513","type":"proceedings-article","created":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T04:11:10Z","timestamp":1558671070000},"page":"1-6","source":"Crossref","is-referenced-by-count":7,"title":["SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET"],"prefix":"10.1109","author":[{"given":"Taiki","family":"Uemura","sequence":"first","affiliation":[]},{"given":"Soonyoung","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Dahye","family":"Min","sequence":"additional","affiliation":[]},{"given":"Ihlhwa","family":"Moon","sequence":"additional","affiliation":[]},{"given":"Seungbae","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Sangwoo","family":"Pae","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488827"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2833875"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2013.6604051"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2005.15"},{"key":"ref14","first-page":"mopoy040","author":"kwon","year":"2016","journal-title":"Design of the 100 MeV Proton Beam Line for Low Flux Application"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1080\/00223131.2013.814553"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6532054"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2008.28"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2005.860719"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2010.5560329"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297681"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/23.556880"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2002.996639"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/0471723703"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353689"},{"key":"ref9","author":"uemura","year":"2018","journal-title":"Sequential Circuit Scan Chain Circuit Including the Same and Integrated Circuit Including the Same"}],"event":{"name":"2019 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2019,3,31]]},"end":{"date-parts":[[2019,4,4]]}},"container-title":["2019 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8712125\/8720395\/08720513.pdf?arnumber=8720513","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:08:35Z","timestamp":1657854515000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8720513\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/irps.2019.8720513","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}