{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,6]],"date-time":"2026-05-06T16:39:28Z","timestamp":1778085568610,"version":"3.51.4"},"reference-count":25,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/irps.2019.8720533","type":"proceedings-article","created":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T04:11:10Z","timestamp":1558671070000},"page":"1-9","source":"Crossref","is-referenced-by-count":6,"title":["Machine Learning for Detection of Competing Wearout Mechanisms"],"prefix":"10.1109","author":[{"given":"Shu-Han","family":"Hsu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kexin","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Linda","family":"Milor","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"265","article-title":"On optimization methods for deep learning","author":"le","year":"2011","journal-title":"Proceedings of the International Conference on Machine Learning"},{"key":"ref11","first-page":"843","article-title":"Quasi-Newton Methods: A New Direction","volume":"14","author":"hennig","year":"2013","journal-title":"Journal of Machine Learning Research"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008669208700"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2008.915629"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2018.8368651"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S0038-1101(02)00151-X"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251190"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241878"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2007.369921"},{"key":"ref19","first-page":"168","article-title":"TDDB Kinetics and their Relationship with the E- and ? E-models","author":"yiang","year":"2008","journal-title":"International Interconnect Technology Conference (IITC)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2016.2588724"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2357756"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/24.75338"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2861769"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1137\/16M1080173"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICBDACI.2017.8070809"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1116\/1.3554904"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2347736.2347755"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2017.8060090"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6531970"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IITC.2007.382357"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2725742"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"73504","DOI":"10.1063\/1.3644972","article-title":"Stress migration model for Cu interconnect reliability analysis","volume":"110","author":"yao","year":"2011","journal-title":"Journal of Applied Physics"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IWASI.2013.6576097"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.1998.653782"}],"event":{"name":"2019 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2019,3,31]]},"end":{"date-parts":[[2019,4,4]]}},"container-title":["2019 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8712125\/8720395\/08720533.pdf?arnumber=8720533","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:13:13Z","timestamp":1657854793000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8720533\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/irps.2019.8720533","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}