{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:54:42Z","timestamp":1730271282804,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/irps.2019.8720547","type":"proceedings-article","created":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T00:11:10Z","timestamp":1558656670000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Positive Bias Instability in ZnO TFTs with Al<sub>2<\/sub>O<sub>3<\/sub> Gate Dielectric"],"prefix":"10.1109","author":[{"given":"Pavel","family":"Bolshakov","sequence":"first","affiliation":[]},{"given":"Rodolfo A.","family":"Rodriguez-Davila","sequence":"additional","affiliation":[]},{"given":"Manuel","family":"Quevedo-Lopez","sequence":"additional","affiliation":[]},{"given":"Chadwin D.","family":"Young","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2007.01.068"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2005.853683"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1149\/1.3456518"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2307352"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.tsf.2013.11.112"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2597284"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.2956406"},{"key":"ref6","article-title":"Threshold Voltage Instabilities in Zinc Oxide Thin Film Transistors with High-k Dielectrics","author":"siddharth","year":"2014","journal-title":"Proc IEEE Int Integra Reliab Works (IRW)"},{"key":"ref5","article-title":"Investigation of Vt Instability in ZnO TFTs with an HfO2 Dielectric","author":"siddharth","year":"2014","journal-title":"18th International Workshop on Dielectrics in Microelectronics"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.49.04DC24"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2018.8452171"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"694","DOI":"10.1109\/JDT.2012.2213237","article-title":"Effects of Gate Insulator on Thin-Film TransistorsWith ZnO Channel Layer Deposited by Plasma-Assisted Atomic Layer Deposition","volume":"9","author":"horita","year":"2013","journal-title":"J Disp Technol"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.tsf.2013.07.069"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1201\/9781420034141"}],"event":{"name":"2019 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2019,3,31]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2019,4,4]]}},"container-title":["2019 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8712125\/8720395\/08720547.pdf?arnumber=8720547","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,14]],"date-time":"2022-07-14T23:22:17Z","timestamp":1657840937000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8720547\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/irps.2019.8720547","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}