{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T10:50:52Z","timestamp":1761648652349},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/irps.2019.8720569","type":"proceedings-article","created":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T04:11:10Z","timestamp":1558671070000},"page":"1-7","source":"Crossref","is-referenced-by-count":3,"title":["Applying Machine Learning to Design for Reliability Coverage"],"prefix":"10.1109","author":[{"given":"Norman","family":"Chang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wentze","family":"Chuang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ganesh Kumar","family":"Tsavatanalli","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joao","family":"Geada","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hao","family":"Zhuang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sankar","family":"Ramachandran","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rahul","family":"Raian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ying-Shiun","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yaowei","family":"Jia","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mathew","family":"Kaipanatu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Suresh Kumar","family":"Mantena","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ming-Chih","family":"Shih","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anita","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Roger","family":"Jang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1971.223410"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/SAI.2014.6918213"},{"key":"ref12","article-title":"Random Forest","author":"breiman","year":"2001","journal-title":"Machine Learning"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/2939672.2939785"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2014.09.003"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2009.5206848"},{"journal-title":"Yahoo! Learning to Rank Challenge","year":"2010","author":"chapelle","key":"ref16"},{"key":"ref17","article-title":"From Ranknet to Lambdarank to Lambdamart: An Overview","author":"burges","year":"2010","journal-title":"Microsoft Research Technical Report MSR-TR-2010–82"},{"key":"ref18","article-title":"IR Evaluation Methods for Retrieving Highly Relevant Documents","author":"jarvelin","year":"2000","journal-title":"Proceedings of the 23rd Annual International ACM SIGIR Conference on Research and Development in Information Retrieval ACM"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391588"},{"journal-title":"Drive Data Platform","year":"0","key":"ref4"},{"journal-title":"GO Automotive Solutions","year":"0","key":"ref3"},{"journal-title":"AI Chips in CoWoS","year":"2017","key":"ref6"},{"journal-title":"Fast-tracking Advanced Driver Assistance System (ADAS) and Autonomous Vehicles Development with Simulation","year":"2017","author":"sovani","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2018.8297359"},{"key":"ref7","article-title":"Challenges in Power-ground Integrity","author":"lin","year":"2001","journal-title":"ICCAD"},{"journal-title":"Automotive Co-pilot System","year":"0","key":"ref2"},{"journal-title":"ADAS Functionalities","year":"0","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3177540.3177554"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2018.112130058"},{"key":"ref22","article-title":"SOC Chip Level Aging Timing Sign-off in Advanced FinFET Technlogies","author":"sun","year":"2017","journal-title":"DAC"},{"key":"ref21","article-title":"Asymmetric Aging Timing Check in SOC","author":"sun","year":"2018","journal-title":"DAC"}],"event":{"name":"2019 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2019,3,31]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2019,4,4]]}},"container-title":["2019 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8712125\/8720395\/08720569.pdf?arnumber=8720569","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:19:08Z","timestamp":1657855148000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8720569\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/irps.2019.8720569","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}