{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T02:58:35Z","timestamp":1725591515566},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/irps.2019.8720583","type":"proceedings-article","created":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T04:11:10Z","timestamp":1558671070000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance"],"prefix":"10.1109","author":[{"given":"Kan","family":"Takeuchi","sequence":"first","affiliation":[]},{"given":"Masaki","family":"Shimada","sequence":"additional","affiliation":[]},{"given":"Shinya","family":"Konishi","sequence":"additional","affiliation":[]},{"given":"Daisuke","family":"Oshida","sequence":"additional","affiliation":[]},{"given":"Naoya","family":"Ota","sequence":"additional","affiliation":[]},{"given":"Takashi","family":"Yasumasu","sequence":"additional","affiliation":[]},{"given":"Koji","family":"Shibutani","sequence":"additional","affiliation":[]},{"given":"Tomohiro","family":"Iwashita","sequence":"additional","affiliation":[]},{"given":"Tetsuya","family":"Kokubun","sequence":"additional","affiliation":[]},{"given":"Fumio","family":"Tsuchiya","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417913"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2016.7574539"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cds.2017.0153"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2013.6653596"},{"journal-title":"JEP122G","article-title":"Failure mechanisms and models for semiconductor devices","year":"2016","key":"ref8"},{"key":"ref7","first-page":"b2l","article-title":"FEOL\/BEOL wear-out estimator using stress-to-frequency conversion of voltage \/ temperature-sensitive ring oscillators for 28 nm automotive MCUs","author":"takeuchi","year":"2016","journal-title":"Proc ESSCIRC"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241868"},{"key":"ref1","first-page":"10","article-title":"BEOL reliability challenges and its interaction with process integration","author":"aubel","year":"2011","journal-title":"IRPS tutorial California USA"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2018.2886566"}],"event":{"name":"2019 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2019,3,31]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2019,4,4]]}},"container-title":["2019 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8712125\/8720395\/08720583.pdf?arnumber=8720583","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:13:13Z","timestamp":1657854793000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8720583\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/irps.2019.8720583","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}