{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,15]],"date-time":"2025-11-15T17:11:57Z","timestamp":1763226717790,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/irps.2019.8720588","type":"proceedings-article","created":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T04:11:10Z","timestamp":1558671070000},"page":"1-5","source":"Crossref","is-referenced-by-count":5,"title":["Reliability Issues in Analog ReRAM Based Neural-Network Processor"],"prefix":"10.1109","author":[{"given":"Ryutaro","family":"Yasuhara","sequence":"first","affiliation":[]},{"given":"Takashi","family":"Ono","sequence":"additional","affiliation":[]},{"given":"Reiji","family":"Mochida","sequence":"additional","affiliation":[]},{"given":"Shunsaku","family":"Muraoka","sequence":"additional","affiliation":[]},{"given":"Kazuyuki","family":"Kouno","sequence":"additional","affiliation":[]},{"given":"Koji","family":"Katayama","sequence":"additional","affiliation":[]},{"given":"Yuriko","family":"Hayata","sequence":"additional","affiliation":[]},{"given":"Masayoshi","family":"Nakayama","sequence":"additional","affiliation":[]},{"given":"Hitoshi","family":"Suwa","sequence":"additional","affiliation":[]},{"given":"Yukio","family":"Hayakawa","sequence":"additional","affiliation":[]},{"given":"Takumi","family":"Mikawa","sequence":"additional","affiliation":[]},{"given":"Yasushi","family":"Gohou","sequence":"additional","affiliation":[]},{"given":"Shinichi","family":"Yoneda","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"73t","article-title":"Conductive Filament Scaling of TaOx Bipolar ReRAM for Long Retention with Low Current Operation","author":"ninomiya","year":"0","journal-title":"2012 Symposium on VLSI Technology"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2008.4796676"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2018.8510676"},{"key":"ref6","first-page":"62t","article-title":"Comprehensive understanding of conductive filament characteristics and retention properties for highly reliable ReRAM","author":"muraoka","year":"0","journal-title":"2013 Symposium on VLS Technology"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131650"},{"key":"ref8","first-page":"661","article-title":"Variety-tolerant Convolutional Neural Network for Pattern Recognition Applications based on OxRAM Synapses","author":"garbin","year":"0","journal-title":"Electron Devices Meeting (IEDM) 2014 IEEE International"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1038\/nature06932"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200900375"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"61","DOI":"10.1038\/nature14441","article-title":"Training and operation of an integrated neuromorphic network based on metal-oxide memristors","volume":"521","author":"prezioso","year":"2015","journal-title":"Nature"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2004.1419228"}],"event":{"name":"2019 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2019,3,31]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2019,4,4]]}},"container-title":["2019 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8712125\/8720395\/08720588.pdf?arnumber=8720588","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:08:35Z","timestamp":1657854515000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8720588\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/irps.2019.8720588","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}