{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T02:57:16Z","timestamp":1725591436504},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/irps.2019.8720593","type":"proceedings-article","created":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T04:11:10Z","timestamp":1558671070000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Modelling Degradation of Matched-Circuits in Operational Conditions: Active and Stand-by Modes"],"prefix":"10.1109","author":[{"given":"Khai","family":"Nguyen","sequence":"first","affiliation":[]},{"given":"Geoff","family":"Liang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/IRPS.2012.6241849"},{"key":"ref3","first-page":"4a.1.1","article-title":"A built-in BTI monitor for long-term data collection in IBM micro processor","author":"lu","year":"0","journal-title":"International Reliability Physics Symposium 2012"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TDMR.2012.2235441"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TCAD.2007.896317"},{"key":"ref7","first-page":"78","article-title":"Product drift from NBTI: Guardbanding, Circuit and Statistical Effects","author":"krisnan","year":"2010","journal-title":"Proc IEDM"},{"key":"ref2","first-page":"148","article-title":"Impact Of Negative Bias Temperature Instability on Product Parameteric Shift","author":"reddy","year":"0","journal-title":"International Test Conference 2004"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TED.2007.902883"}],"event":{"name":"2019 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2019,3,31]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2019,4,4]]}},"container-title":["2019 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8712125\/8720395\/08720593.pdf?arnumber=8720593","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:19:08Z","timestamp":1657855148000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8720593\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/irps.2019.8720593","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}