{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,6]],"date-time":"2025-10-06T18:23:08Z","timestamp":1759774988669,"version":"3.28.0"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/irps.2019.8720596","type":"proceedings-article","created":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T04:11:10Z","timestamp":1558671070000},"page":"1-4","source":"Crossref","is-referenced-by-count":5,"title":["Wafer-Scale TaO<sub>x<\/sub> Device Variability and Implications for Neuromorphic Computing Applications"],"prefix":"10.1109","author":[{"given":"Christopher H.","family":"Bennett","sequence":"first","affiliation":[]},{"given":"Diana","family":"Garland","sequence":"additional","affiliation":[]},{"given":"Robin B.","family":"Jacobs-Gedrim","sequence":"additional","affiliation":[]},{"given":"Sapan","family":"Agarwal","sequence":"additional","affiliation":[]},{"given":"Matthew J.","family":"Marinella","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"Training a Neural Network on Analog TaOx RRAM Devices Irradiated with Heavy Ions: Effects on Classification Accuracy Demonstrated with CrossSim","author":"jacobs-gedrim","year":"2018","journal-title":"IEEE Transactions on Nuclear Science"},{"journal-title":"CrossSim","year":"2017","author":"agarwal","key":"ref11"},{"journal-title":"UCI Machine Learning Repository","year":"0","author":"bache","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2016.7727298"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2015.09.156"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1038\/srep31932"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2789723"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838434"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2744930"},{"key":"ref3","first-page":"194","article-title":"Mitigating effects of nonideal synaptic device characteristics for on-chip learning","author":"chen","year":"2015","journal-title":"Proceedings of the IEEE\/ACM International Conference on Computer-Aided Design"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/nmat3070"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-018-04484-2"},{"key":"ref8","article-title":"Multi-layer tunnel barrier (Ta 2 O 5\/TaO x\/TiO 2) engineering for bipolar RRAM selector applications","author":"jiyong","year":"2013","journal-title":"VLSI Technology (VLSIT) 2013 Symposium on"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2224377"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2018.2796379"},{"key":"ref1","first-page":"89","article-title":"Neuromorphic computing using nonvolatile memory","volume":"1","author":"burr","year":"2017","journal-title":"Adv Phys X"},{"key":"ref9","first-page":"55204","article-title":"Modulation of nonlinear resistive switching behavior of a TaOx-based resistive device through interface engineering","volume":"28 5","author":"zongwei","year":"2016","journal-title":"Nanotechnology"}],"event":{"name":"2019 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2019,3,31]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2019,4,4]]}},"container-title":["2019 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8712125\/8720395\/08720596.pdf?arnumber=8720596","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:13:13Z","timestamp":1657854793000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8720596\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/irps.2019.8720596","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}