{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,6]],"date-time":"2025-12-06T17:08:53Z","timestamp":1765040933396,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/irps.2019.8720601","type":"proceedings-article","created":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T00:11:10Z","timestamp":1558656670000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Surrogate Model Assisted Design of Silicon Anode Considering Lithiation Induced Stresses"],"prefix":"10.1109","author":[{"given":"Zhuoyuan","family":"Zheng","sequence":"first","affiliation":[]},{"given":"Bo","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Yashraj","family":"Gurumukhi","sequence":"additional","affiliation":[]},{"given":"John","family":"Cook","sequence":"additional","affiliation":[]},{"given":"Mehmet N.","family":"Ates","sequence":"additional","affiliation":[]},{"given":"Nenad","family":"Miljkovic","sequence":"additional","affiliation":[]},{"given":"Paul V.","family":"Braun","sequence":"additional","affiliation":[]},{"given":"Pingfeng","family":"Wang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2013.12.020"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1115\/1.4040883"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.actamat.2016.01.064"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1149\/1.3526597"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1149\/1.3205485"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2009.01.021"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1021\/cr030203g"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ssi.2008.12.015"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1063\/1.4997978"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1149\/2.0151711jes"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2006.09.084"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1149\/1.2127495"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1021\/nl204551m"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.nanoen.2015.09.016"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"74002","DOI":"10.1088\/0965-0393\/21\/7\/074002","article-title":"Mechanical properties of amorphous Li x Si alloys: a reactive force field study","volume":"21","author":"feifei","year":"2013","journal-title":"Modelling and Simulation in Materials Science and Engineering"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1021\/nl901670t"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/451652a"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/35104644"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1149\/2.0841702jes"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1080\/0305215X.2013.795561"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.05.007"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1115\/1.4026033"}],"event":{"name":"2019 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2019,3,31]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2019,4,4]]}},"container-title":["2019 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8712125\/8720395\/08720601.pdf?arnumber=8720601","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,14]],"date-time":"2022-07-14T23:22:17Z","timestamp":1657840937000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8720601\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/irps.2019.8720601","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}