{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T10:23:34Z","timestamp":1725704614429},"reference-count":2,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/irps.2019.8720604","type":"proceedings-article","created":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T04:11:10Z","timestamp":1558671070000},"page":"1-4","source":"Crossref","is-referenced-by-count":5,"title":["Understanding EM-Degradation Mechanisms in Metal Heaters Used for Si Photonics Applications"],"prefix":"10.1109","author":[{"given":"K.","family":"Croes","sequence":"first","affiliation":[]},{"given":"V.","family":"Simons","sequence":"additional","affiliation":[]},{"given":"S.","family":"Beyne","sequence":"additional","affiliation":[]},{"given":"V.","family":"Cherman","sequence":"additional","affiliation":[]},{"given":"H.","family":"Oprins","sequence":"additional","affiliation":[]},{"given":"M.","family":"Stucchi","sequence":"additional","affiliation":[]},{"given":"Ph.","family":"Absil","sequence":"additional","affiliation":[]},{"given":"A.","family":"Glabman","sequence":"additional","affiliation":[]},{"given":"E.","family":"Wilcox","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1016\/j.microrel.2005.05.015"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/IEDM.2017.8268494"}],"event":{"name":"2019 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2019,3,31]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2019,4,4]]}},"container-title":["2019 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8712125\/8720395\/08720604.pdf?arnumber=8720604","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:19:08Z","timestamp":1657855148000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8720604\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":2,"URL":"https:\/\/doi.org\/10.1109\/irps.2019.8720604","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}