{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,3]],"date-time":"2026-03-03T02:15:58Z","timestamp":1772504158285,"version":"3.50.1"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/irps.2019.8720610","type":"proceedings-article","created":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T04:11:10Z","timestamp":1558671070000},"page":"1-7","source":"Crossref","is-referenced-by-count":9,"title":["Accelerated Device Degradation of High-Speed Ge Waveguide Photodetectors"],"prefix":"10.1109","author":[{"given":"A.","family":"Lesniewska","sequence":"first","affiliation":[]},{"given":"S. A.","family":"Srinivasan","sequence":"additional","affiliation":[]},{"given":"J.","family":"Van Campenhout","sequence":"additional","affiliation":[]},{"given":"B. J.","family":"O'Sullivan","sequence":"additional","affiliation":[]},{"given":"K.","family":"Croes","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","year":"2004","journal-title":"Telcordia Technologies Generic Requirements GR-486-CORE"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268494"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2016.2604839"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1364\/IPRSN.2014.IW3A.4"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.4749259"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.3126523"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2014.2367134"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2009.2017040"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4953147"}],"event":{"name":"2019 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2019,3,31]]},"end":{"date-parts":[[2019,4,4]]}},"container-title":["2019 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8712125\/8720395\/08720610.pdf?arnumber=8720610","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:22:16Z","timestamp":1657855336000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8720610\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/irps.2019.8720610","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}