{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T13:35:35Z","timestamp":1725716135658},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/irps45951.2020.9128219","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T17:20:26Z","timestamp":1593537626000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["Radiation Tolerance of 3-D NAND Flash Based Neuromorphic Computing System"],"prefix":"10.1109","author":[{"given":"Md Mehedi","family":"Hasan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Md","family":"Raquibuzzaman","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Indranil","family":"Chatterjee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Biswajit","family":"Ray","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/cryptography2030017"},{"year":"0","key":"ref11","article-title":"MNIST handwritten digit database, Yann LeCun, Corinna Cortes and Chris Burges"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/computers6040028"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/23.45415"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2220156"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2254497"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.2001040"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2161885"},{"key":"ref8","first-page":"1","article-title":"Total Ionizing Dose Effects in 3D NAND Flash Memories","author":"bagatin","year":"2018","journal-title":"IEEE Trans Nucl Sci"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/NSREC.2018.8584286"},{"key":"ref2","first-page":"169:1","article-title":"On-chip Deep Neural Network Storage with Multi-level eNVM","author":"donato","year":"2018","journal-title":"Proceedings of the 55th Annual Design Automation Conference"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2018.8388776"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2017.61"}],"event":{"name":"2020 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2020,4,28]]},"location":"Dallas, TX, USA","end":{"date-parts":[[2020,5,30]]}},"container-title":["2020 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125439\/9128217\/09128219.pdf?arnumber=9128219","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T17:51:39Z","timestamp":1656438699000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9128219\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/irps45951.2020.9128219","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}