{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T02:44:37Z","timestamp":1725590677500},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/irps45951.2020.9128225","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T17:20:26Z","timestamp":1593537626000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Reliability and Robustness Performance of 1200 V SiC DMOSFETs"],"prefix":"10.1109","author":[{"given":"Siddarth","family":"Sundaresan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vamsi","family":"Mulpuri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jaehoon","family":"Park","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ranbir","family":"Singh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/WiPDA.2015.7369309"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2019.8720488"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2006.889890"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2017.06.093"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2621099"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2017.7931015"}],"event":{"name":"2020 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2020,4,28]]},"location":"Dallas, TX, USA","end":{"date-parts":[[2020,5,30]]}},"container-title":["2020 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125439\/9128217\/09128225.pdf?arnumber=9128225","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,8]],"date-time":"2022-07-08T22:19:37Z","timestamp":1657318777000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9128225\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/irps45951.2020.9128225","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}