{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T21:04:17Z","timestamp":1725743057519},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/irps45951.2020.9128322","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T21:20:26Z","timestamp":1593552026000},"page":"1-5","source":"Crossref","is-referenced-by-count":6,"title":["Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology"],"prefix":"10.1109","author":[{"given":"Hai","family":"Jiang","sequence":"first","affiliation":[]},{"given":"Hyunchul","family":"Sagong","sequence":"additional","affiliation":[]},{"given":"Jinju","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Hyewon","family":"Shim","sequence":"additional","affiliation":[]},{"given":"Yoohwan","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Junekyun","family":"Park","sequence":"additional","affiliation":[]},{"given":"Taiki","family":"Uemura","sequence":"additional","affiliation":[]},{"given":"Yongsung","family":"Ji","sequence":"additional","affiliation":[]},{"given":"Taeyoung","family":"Jeong","sequence":"additional","affiliation":[]},{"given":"Dongkyun","family":"Kwon","sequence":"additional","affiliation":[]},{"given":"Hwasung","family":"Rhee","sequence":"additional","affiliation":[]},{"given":"Sangwoo","family":"Pae","sequence":"additional","affiliation":[]},{"given":"Brandon","family":"Lee","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353640"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2444879"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2015.7112712"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIT.2017.7998153"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2018.8510673"},{"key":"ref15","article-title":"FinFET Self-heating and its Implications on Reliability evaluations","author":"mittl","year":"0","journal-title":"2016 IRPS tutorial"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6860642"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2487045"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2162333"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/29\/11\/115021"},{"key":"ref8","first-page":"557","article-title":"Considering physical mechanisms and geometry dependencies in 14nm FinFET circuit aging and product validations","author":"pae","year":"2016","journal-title":"Technical Digest of 2015 IEEE International Electron Devices Meeting"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2646907"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2016.7574506"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2018.8510657"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6532036"}],"event":{"name":"2020 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2020,4,28]]},"location":"Dallas, TX, USA","end":{"date-parts":[[2020,5,30]]}},"container-title":["2020 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125439\/9128217\/09128322.pdf?arnumber=9128322","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:19:37Z","timestamp":1657333177000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9128322\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/irps45951.2020.9128322","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}