{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:55:20Z","timestamp":1730271320537,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/irps45951.2020.9128839","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T21:20:26Z","timestamp":1593552026000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System"],"prefix":"10.1109","author":[{"given":"Andrew","family":"Keller","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jared","family":"Anderson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael","family":"Wirthlin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shi-Jie","family":"Wen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rita","family":"Fung","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Conner","family":"Chambers","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","article-title":"An introduction to radiation-induced failure modes and related mitigation methods for Xilinx SRAM FPGAs","author":"quinn","year":"2008","journal-title":"ERSA"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-7595-9_3"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2086075"},{"key":"ref6","article-title":"Measurement and reporting of alpha particle and terrestrial cosmic ray-induced soft errors in semiconductor devices","volume":"89a","year":"2006","journal-title":"JEDEC Solid State Technology Association Std"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.2000852"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2008.4526470"},{"key":"ref12","article-title":"Validation of Partial Duplication With Compare for FPGA Systems","author":"wirthlin","year":"2019","journal-title":"STFC ISIS Neutron and Muon Source"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2259503"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2016.7589601"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/FCCM.2005.61"},{"key":"ref9","article-title":"Soft error mitigation using prioritized essential bits","author":"le","year":"2012","journal-title":"Application Note"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.2001742"}],"event":{"name":"2020 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2020,4,28]]},"location":"Dallas, TX, USA","end":{"date-parts":[[2020,5,30]]}},"container-title":["2020 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125439\/9128217\/09128839.pdf?arnumber=9128839","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:21:19Z","timestamp":1657333279000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9128839\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/irps45951.2020.9128839","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}