{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T02:44:59Z","timestamp":1725590699828},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/irps45951.2020.9128911","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T21:20:26Z","timestamp":1593552026000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Reliability and Breakdown Study of Erase Gate Oxide in Split-Gate Non-Volatile Memory Device"],"prefix":"10.1109","author":[{"given":"L.","family":"Luo","sequence":"first","affiliation":[]},{"given":"K.","family":"Shubhakar","sequence":"additional","affiliation":[]},{"given":"S.","family":"Mei","sequence":"additional","affiliation":[]},{"given":"N.","family":"Raghavan","sequence":"additional","affiliation":[]},{"given":"F.","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"D.","family":"Shum","sequence":"additional","affiliation":[]},{"given":"K. L.","family":"Pey","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.3056659"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2016.7495290"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2016.7495271"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.57.14958"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.815141"},{"key":"ref15","article-title":"Stochastic Modeling of Degradation Behavior in Split-Gate Non-Volatile Memory Devices","author":"mei","year":"2019","journal-title":"IEEE Transactions on Device and Materials Reliability"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(02)00058-6"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2003.811713"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2012.6213670"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(01)00120-2"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2015.7224346"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2005.1469355"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1988.32849"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"584","DOI":"10.1109\/IEDM.1986.191257","article-title":"a novel high-speed, 5-volt programming eprom structure with source-side injection","author":"wu","year":"1986","journal-title":"1986 International Electron Devices Meeting"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.2146071"}],"event":{"name":"2020 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2020,4,28]]},"location":"Dallas, TX, USA","end":{"date-parts":[[2020,5,30]]}},"container-title":["2020 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125439\/9128217\/09128911.pdf?arnumber=9128911","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:21:13Z","timestamp":1657333273000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9128911\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/irps45951.2020.9128911","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}