{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,18]],"date-time":"2025-12-18T14:13:08Z","timestamp":1766067188033},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/irps45951.2020.9129130","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T21:20:26Z","timestamp":1593552026000},"page":"1-5","source":"Crossref","is-referenced-by-count":8,"title":["Origins and Signatures of Tail Bit Failures in Ultrathin MgO Based STT-MRAM"],"prefix":"10.1109","author":[{"given":"J. H.","family":"Lim","sequence":"first","affiliation":[]},{"given":"N.","family":"Raghavan","sequence":"additional","affiliation":[]},{"given":"J. H.","family":"Kwon","sequence":"additional","affiliation":[]},{"given":"T. Y.","family":"Lee","sequence":"additional","affiliation":[]},{"given":"R.","family":"Chao","sequence":"additional","affiliation":[]},{"given":"N. L.","family":"Chung","sequence":"additional","affiliation":[]},{"given":"K.","family":"Yamane","sequence":"additional","affiliation":[]},{"given":"N.","family":"Thiyagarajah","sequence":"additional","affiliation":[]},{"given":"V. B.","family":"Naik","sequence":"additional","affiliation":[]},{"given":"K. L.","family":"Pey","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1116\/1.4972871"},{"key":"ref3","first-page":"2c.2.1","article-title":"Superior Endurance Performance of 22-nm Embedded MRAM Technology","author":"naik","year":"2018","journal-title":"IEEE International Reliability Physics Symposium (IRPS)"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevApplied.9.054010"},{"key":"ref6","first-page":"100","article-title":"Spatial Mapping of Non-Uniform Time-to-Breakdown and Physical Evidence of Defect Clustering","author":"wu","year":"2017","journal-title":"IEEE Symposium on VLSI Technology Digest of Technical Papers"},{"key":"ref5","first-page":"5b.2.1","article-title":"Time-Dependent Clustering Model versus Combination-Based Approach for BEOL\/MOL and FEOL Non-Uniform Dielectric Breakdown: Similarities and Disparities","author":"wu","year":"2016","journal-title":"IEEE International Reliability Physics Symposium (IRPS)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.93.224432"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/ma9010041"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614566"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LMAG.2019.2928243"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993454"}],"event":{"name":"2020 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2020,4,28]]},"location":"Dallas, TX, USA","end":{"date-parts":[[2020,5,30]]}},"container-title":["2020 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125439\/9128217\/09129130.pdf?arnumber=9129130","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:20:21Z","timestamp":1657333221000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9129130\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/irps45951.2020.9129130","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}