{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,23]],"date-time":"2025-09-23T13:40:15Z","timestamp":1758634815996,"version":"3.28.0"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/irps45951.2020.9129245","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T17:20:26Z","timestamp":1593537626000},"page":"1-5","source":"Crossref","is-referenced-by-count":9,"title":["Analysis of The Hole Trapping Detrapping Component of NBTI Over Extended Temperature Range"],"prefix":"10.1109","author":[{"given":"Nilotpal","family":"Choudhury","sequence":"first","affiliation":[]},{"given":"Narendra","family":"Parihar","sequence":"additional","affiliation":[]},{"given":"Souvik","family":"Mahapatra","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/SISPAD.2018.8551740"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2906339"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2014.7047093"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2009.5173220"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6532117"},{"key":"ref15","article-title":"A Model for Hole Trapping-Detrapping Kinetics During NBTI in p-Channel FETs","author":"choudhury","year":"0","journal-title":"2020 IEEE Electron Devices Technology and Manufacturing (EDTM)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/SISPAD.2019.8870524"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488859"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2010.5703435"},{"key":"ref19","doi-asserted-by":"crossref","first-page":"1053","DOI":"10.1007\/BF02660189","article-title":"A study of deep levels in GaAs by capacitance spectroscopy","volume":"4","author":"lang","year":"1975","journal-title":"JEM"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2773122"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/SISPAD.2018.8551724"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2017.12.035"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936415"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936264"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.04.002"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353699"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2780083"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2819023"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2020.2967696"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353700"}],"event":{"name":"2020 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2020,4,28]]},"location":"Dallas, TX, USA","end":{"date-parts":[[2020,5,30]]}},"container-title":["2020 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125439\/9128217\/09129245.pdf?arnumber=9129245","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,8]],"date-time":"2022-07-08T22:21:19Z","timestamp":1657318879000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9129245\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/irps45951.2020.9129245","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}