{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,14]],"date-time":"2026-02-14T10:25:50Z","timestamp":1771064750816,"version":"3.50.1"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/irps45951.2020.9129513","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T21:20:26Z","timestamp":1593552026000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping"],"prefix":"10.1109","author":[{"given":"Bernhard","family":"Ruch","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gregor","family":"Pobegen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christian","family":"Schleich","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tibor","family":"Grasser","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/0026-2714(96)00022-4"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.09.002"},{"key":"ref12","year":"0","journal-title":"Comphy"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.04.002"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2262521"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2503920"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/0167-9317(95)00006-T"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.373759"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353540"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2014.7047093"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2019.06.010"},{"key":"ref3","author":"grasser","year":"2014","journal-title":"Hot Carrier Degradation in Semiconductor Devices"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2008.06.018"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IIRW.2012.6468962"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1984.21472"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2013.2265015"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2010.07.030"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/ip-i-1.1983.0026"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2008.2002352"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1063\/1.363349"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/4\/12\/009"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1063\/1.118769"}],"event":{"name":"2020 IEEE International Reliability Physics Symposium (IRPS)","location":"Dallas, TX, USA","start":{"date-parts":[[2020,4,28]]},"end":{"date-parts":[[2020,5,30]]}},"container-title":["2020 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125439\/9128217\/09129513.pdf?arnumber=9129513","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:21:13Z","timestamp":1657333273000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9129513\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/irps45951.2020.9129513","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}