{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,6]],"date-time":"2026-04-06T06:06:45Z","timestamp":1775455605935,"version":"3.50.1"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/irps45951.2020.9129540","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T21:20:26Z","timestamp":1593552026000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices"],"prefix":"10.1109","author":[{"given":"Maurits J.","family":"de Jong","sequence":"first","affiliation":[]},{"given":"Cora","family":"Salm","sequence":"additional","affiliation":[]},{"given":"Jurriaan","family":"Schmitz","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"980","DOI":"10.1088\/0268-1242\/4\/12\/003","article-title":"Models of Si-SiO2 interface reactions","volume":"4","author":"reed","year":"1989","journal-title":"Semiconductor Science and Technology"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.324180"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.solmat.2010.05.015"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.1384860"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IRWS.2004.1422727"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(02)00027-6"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1984.21472"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2019.06.010"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1002\/admi.201700058"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.116172"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241945"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.876041"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.07.057"},{"key":"ref5","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-319-08994-2","author":"grasser","year":"2015","journal-title":"Hot Carrier Degradation in Semiconductor Devices"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2787778"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2262521"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/1.116308"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.surfcoat.2017.11.013"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2016.2616133"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2017.07.038"}],"event":{"name":"2020 IEEE International Reliability Physics Symposium (IRPS)","location":"Dallas, TX, USA","start":{"date-parts":[[2020,4,28]]},"end":{"date-parts":[[2020,5,30]]}},"container-title":["2020 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125439\/9128217\/09129540.pdf?arnumber=9129540","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,3]],"date-time":"2023-10-03T06:56:44Z","timestamp":1696316204000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9129540\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/irps45951.2020.9129540","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}