{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,20]],"date-time":"2025-08-20T12:42:34Z","timestamp":1755693754655},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,3]]},"DOI":"10.1109\/irps46558.2021.9405101","type":"proceedings-article","created":{"date-parts":[[2021,4,26]],"date-time":"2021-04-26T22:48:05Z","timestamp":1619477285000},"page":"1-7","source":"Crossref","is-referenced-by-count":6,"title":["Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology"],"prefix":"10.1109","author":[{"given":"Taiki","family":"Uemura","sequence":"first","affiliation":[]},{"given":"Byungjin","family":"Chung","sequence":"additional","affiliation":[]},{"given":"Jeongmin","family":"Jo","sequence":"additional","affiliation":[]},{"given":"Mijoung","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Dalhee","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Gunrae","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Seungbae","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Taesjoong","family":"Song","sequence":"additional","affiliation":[]},{"given":"Hwasung","family":"Rhee","sequence":"additional","affiliation":[]},{"given":"Brandon","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Jaehee","family":"Choi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2019.8720513"},{"journal-title":"Digital System Clocking High-Performance and Low-Power Aspects","year":"2005","author":"oklobdzija","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2003.1281368"},{"journal-title":"JEDEC Solid State Technol Assoc","article-title":"Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray Induced Soft Error in Semiconductor Devices: JESD89A","year":"2006","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/SISPAD.2016.7605205"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2005.15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488827"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2019.8720556"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2833875"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353583"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353584"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310252"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIT.2017.7998202"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2218128"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2015.7112728"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2018.8510682"}],"event":{"name":"2021 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2021,3,21]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2021,3,25]]}},"container-title":["2021 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9405068\/9405088\/09405101.pdf?arnumber=9405101","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:19:38Z","timestamp":1657333178000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9405101\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,3]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/irps46558.2021.9405101","relation":{},"subject":[],"published":{"date-parts":[[2021,3]]}}}