{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,11]],"date-time":"2025-11-11T13:41:45Z","timestamp":1762868505540},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,3]]},"DOI":"10.1109\/irps46558.2021.9405110","type":"proceedings-article","created":{"date-parts":[[2021,4,26]],"date-time":"2021-04-26T22:48:05Z","timestamp":1619477285000},"page":"1-5","source":"Crossref","is-referenced-by-count":2,"title":["Estimation of Oxide Breakdown Voltage During a CDM Event Using Very Fast Transmission Line Pulse and Transmission Line Pulse Measurements"],"prefix":"10.1109","author":[{"given":"Chloe","family":"Troussier","sequence":"first","affiliation":[]},{"given":"Johan","family":"Bourgeat","sequence":"additional","affiliation":[]},{"given":"Blaise","family":"Jacquier","sequence":"additional","affiliation":[]},{"given":"Emmanuel","family":"Simeu","sequence":"additional","affiliation":[]},{"given":"Jean-Daniel","family":"Arnould","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"135","article-title":"Ultrafast RVS as an Efficient Method to Measure Oxide Breakdown in the EOS and ESD Time Domain","author":"van beek","year":"2020","journal-title":"2020 Electrical Overstress\/Electrostatic Discharge Symposium"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2009.5173315"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2021721"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/16.662800"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCDCS.2008.4542669"},{"key":"ref1","first-page":"285","article-title":"Ultra-thin gate oxide reliability in the esd time domain","author":"a ille","year":"2006","journal-title":"2006 Electrical Overstress\/Electrostatic Discharge Symposium eos\/esd"}],"event":{"name":"2021 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2021,3,21]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2021,3,25]]}},"container-title":["2021 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9405068\/9405088\/09405110.pdf?arnumber=9405110","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:20:32Z","timestamp":1657333232000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9405110\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,3]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/irps46558.2021.9405110","relation":{},"subject":[],"published":{"date-parts":[[2021,3]]}}}