{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,19]],"date-time":"2026-02-19T04:43:46Z","timestamp":1771476226689,"version":"3.50.1"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,3]]},"DOI":"10.1109\/irps46558.2021.9405120","type":"proceedings-article","created":{"date-parts":[[2021,4,26]],"date-time":"2021-04-26T22:48:05Z","timestamp":1619477285000},"page":"1-5","source":"Crossref","is-referenced-by-count":6,"title":["Embedded emerging memory technologies for neuromorphic computing: temperature instability and reliability"],"prefix":"10.1109","author":[{"given":"Yao-Feng","family":"Chang","sequence":"first","affiliation":[]},{"given":"Ilya","family":"Karpov","sequence":"additional","affiliation":[]},{"given":"Reed","family":"Hopkins","sequence":"additional","affiliation":[]},{"given":"David","family":"Janosky","sequence":"additional","affiliation":[]},{"given":"Jacob","family":"Medeiros","sequence":"additional","affiliation":[]},{"given":"Benjamin","family":"Sherrill","sequence":"additional","affiliation":[]},{"given":"Jiahan","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Yifu","family":"Huang","sequence":"additional","affiliation":[]},{"given":"Tanmoy","family":"Pramanik","sequence":"additional","affiliation":[]},{"given":"Albert","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Tony","family":"Acosta","sequence":"additional","affiliation":[]},{"given":"Abdullah","family":"Guler","sequence":"additional","affiliation":[]},{"given":"James A.","family":"O'Donnell","sequence":"additional","affiliation":[]},{"given":"Pedro A","family":"Quintero","sequence":"additional","affiliation":[]},{"given":"Nathan","family":"Strutt","sequence":"additional","affiliation":[]},{"given":"Oleg","family":"Golonzka","sequence":"additional","affiliation":[]},{"given":"Chris","family":"Connor","sequence":"additional","affiliation":[]},{"given":"Jack C","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Jeffrey","family":"Hicks","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1186\/s11671-015-0740-7","article-title":"Physical and chemical mechanisms in oxide-based resistance random access memory","volume":"10","author":"chang","year":"2015","journal-title":"Nanoscale Research Letters"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.4964872"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.4891244"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-018-25215-z"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1038\/srep12867"},{"key":"ref15","first-page":"24.3","article-title":"First Demonstration of OxRRAM Integration on 14nm FinFet Platform and Scaling Potential Analysis towards Sub-10nm Node","author":"xu","year":"2020","journal-title":"IEDM"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1039\/C7RA00567A"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1039\/C8NR06694A"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIT.2019.8776570"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0092-2"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.78.180411"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614620"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662444"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662393"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2012.240"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0054-8"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-019-56714-2"}],"event":{"name":"2021 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2021,3,21]]},"end":{"date-parts":[[2021,3,25]]}},"container-title":["2021 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9405068\/9405088\/09405120.pdf?arnumber=9405120","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:19:30Z","timestamp":1657333170000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9405120\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,3]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/irps46558.2021.9405120","relation":{},"subject":[],"published":{"date-parts":[[2021,3]]}}}