{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:55:55Z","timestamp":1730271355406,"version":"3.28.0"},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,3]]},"DOI":"10.1109\/irps46558.2021.9405138","type":"proceedings-article","created":{"date-parts":[[2021,4,26]],"date-time":"2021-04-26T22:48:05Z","timestamp":1619477285000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["An efficient methodology to evaluate BEOL and MOL TDDB in advanced nodes"],"prefix":"10.1109","author":[{"given":"S.","family":"Jose","sequence":"first","affiliation":[]},{"given":"C.","family":"Yin","sequence":"additional","affiliation":[]},{"given":"Y.","family":"Chen","sequence":"additional","affiliation":[]},{"given":"C. M.","family":"Hong","sequence":"additional","affiliation":[]},{"given":"M. D.","family":"Shroff","sequence":"additional","affiliation":[]},{"given":"X. L.","family":"Zhao","sequence":"additional","affiliation":[]},{"given":"F.","family":"Zhang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6860610"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936326"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6860613"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IITC.2009.5090383"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS45951.2020.9129094"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2508155"},{"key":"ref1","first-page":"755","article-title":"Statistics of breakdown field and time-dependent dielectric breakdown in contact-to-poly modules","volume":"63","author":"yokogawa","year":"2016","journal-title":"IEEE Transactions on Electron Devices"}],"event":{"name":"2021 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2021,3,21]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2021,3,25]]}},"container-title":["2021 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9405068\/9405088\/09405138.pdf?arnumber=9405138","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:20:33Z","timestamp":1657333233000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9405138\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,3]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/irps46558.2021.9405138","relation":{},"subject":[],"published":{"date-parts":[[2021,3]]}}}