{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,14]],"date-time":"2026-02-14T10:26:03Z","timestamp":1771064763060,"version":"3.50.1"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003407","name":"Ministry of Education, Universities and Research (MIUR)","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003407","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,3]]},"DOI":"10.1109\/irps46558.2021.9405142","type":"proceedings-article","created":{"date-parts":[[2021,4,26]],"date-time":"2021-04-26T22:48:05Z","timestamp":1619477285000},"page":"1-5","source":"Crossref","is-referenced-by-count":8,"title":["A Generalized Approach to Determine the Switching Reliability of GaN HEMTs on-Wafer Level"],"prefix":"10.1109","author":[{"given":"Nicola","family":"Modolo","sequence":"first","affiliation":[]},{"given":"Andrea","family":"Minetto","sequence":"additional","affiliation":[]},{"given":"Carlo","family":"De Santi","sequence":"additional","affiliation":[]},{"given":"Luca","family":"Sayadi","sequence":"additional","affiliation":[]},{"given":"Sebastien","family":"Sicre","sequence":"additional","affiliation":[]},{"given":"Gerhard","family":"Prechtl","sequence":"additional","affiliation":[]},{"given":"Gaudenzio","family":"Meneghesso","sequence":"additional","affiliation":[]},{"given":"Enrico","family":"Zanoni","sequence":"additional","affiliation":[]},{"given":"Matteo","family":"Meneghini","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936308"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2011.2181815"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2002.808150"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3025983"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2006.306552"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1116\/1.4807904"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2728785"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6861112"},{"key":"ref6","article-title":"A Novel On-Wafer Approach to Test the Stability of GaN-based Devices in Hard Switching Conditions: Study of Hot-Electron Effects","author":"modolo","year":"2020","journal-title":"ESREF"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.2968212"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2890874"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353594"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS45951.2020.9129631"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2016.7574528"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6641\/abc456"}],"event":{"name":"2021 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2021,3,21]]},"end":{"date-parts":[[2021,3,25]]}},"container-title":["2021 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9405068\/9405088\/09405142.pdf?arnumber=9405142","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:20:32Z","timestamp":1657333232000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9405142\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,3]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/irps46558.2021.9405142","relation":{},"subject":[],"published":{"date-parts":[[2021,3]]}}}