{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,28]],"date-time":"2026-02-28T14:29:29Z","timestamp":1772288969506,"version":"3.50.1"},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,3]]},"DOI":"10.1109\/irps46558.2021.9405170","type":"proceedings-article","created":{"date-parts":[[2021,4,26]],"date-time":"2021-04-26T22:48:05Z","timestamp":1619477285000},"page":"1-4","source":"Crossref","is-referenced-by-count":5,"title":["Gate Driver Protection Methods for SiC MOSFET Short Circuit Testing"],"prefix":"10.1109","author":[{"given":"Jairo","family":"Nevarez","sequence":"first","affiliation":[]},{"given":"Anthony","family":"Olmedo","sequence":"additional","affiliation":[]},{"given":"Rachel","family":"Williams","sequence":"additional","affiliation":[]},{"given":"Polina","family":"Pechnikova","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/SECON2018.8478850"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2018.8557500"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICRERA.2016.7884409"},{"key":"ref5","year":"0","journal-title":"Bootstrap Circuitry Selection for Half-Bridge Configurations"},{"key":"ref7","year":"0","journal-title":"MOSFET Gate Drive Circuit"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DEMPED.2015.7303671"},{"key":"ref1","year":"2002","journal-title":"Short Circuit Withstand Time Test Method"}],"event":{"name":"2021 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2021,3,21]]},"end":{"date-parts":[[2021,3,25]]}},"container-title":["2021 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9405068\/9405088\/09405170.pdf?arnumber=9405170","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:19:30Z","timestamp":1657333170000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9405170\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,3]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/irps46558.2021.9405170","relation":{},"subject":[],"published":{"date-parts":[[2021,3]]}}}