{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T15:27:03Z","timestamp":1759332423082},"reference-count":29,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,3]]},"DOI":"10.1109\/irps46558.2021.9405188","type":"proceedings-article","created":{"date-parts":[[2021,4,26]],"date-time":"2021-04-26T22:48:05Z","timestamp":1619477285000},"source":"Crossref","is-referenced-by-count":9,"title":["Machine Learning On Transistor Aging Data: Test Time Reduction and Modeling for Novel Devices"],"prefix":"10.1109","author":[{"given":"Neel","family":"Chatterjee","sequence":"first","affiliation":[]},{"given":"John","family":"Ortega","sequence":"additional","affiliation":[]},{"given":"Inanc","family":"Meric","sequence":"additional","affiliation":[]},{"given":"Peng","family":"Xiao","sequence":"additional","affiliation":[]},{"given":"Ilan","family":"Tsameret","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.0c05267"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevMaterials.2.085407"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.solidstatesciences.2005.10.011"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1038\/nature14539"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/el:19921124"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-017-0984-9"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CSTIC49141.2020.9282457"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268472"},{"key":"ref18","first-page":"282","article-title":"Gaussian Processes for Big Data","author":"hensman","year":"2013","journal-title":"Uncertain Artif Intell - Proc 29th Conf UAI 2013"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1162\/neco.2008.08-07-592"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2020.3048918"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993603"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CSTIC49141.2020.9282457"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2009.5173404"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2011.09.088"},{"key":"ref29","article-title":"A Tutorial on Bayesian Optimization","author":"frazier","year":"0","journal-title":"ArXiv"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.promfg.2017.07.353"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/SISPAD.2019.8870467"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2020.3045064"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS45951.2020.9129601"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1038\/s41565-020-00779-y"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IIRW.2016.7904909"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1111\/j.2517-6161.1996.tb02080.x"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1023\/B:STCO.0000035301.49549.88"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1970.10488635"},{"key":"ref24","author":"williams","year":"0","journal-title":"Gaussian Processes for Regression"},{"key":"ref23","author":"rasmussen","year":"2006","journal-title":"Gaussian processes for machine learning the mit press"},{"key":"ref26","year":"2001","journal-title":"A Procedure for Measuring N-Channel MOSFET Hot-Carrier-Induced Degradation Under DC Stress"},{"key":"ref25","author":"qui\u00f1onero","year":"2005","journal-title":"A Unifying View of Sparse Approximate Gaussian Process Regression"}],"event":{"name":"2021 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2021,3,21]]},"end":{"date-parts":[[2021,3,25]]}},"container-title":["2021 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9405068\/9405088\/09405188.pdf?arnumber=9405188","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:20:33Z","timestamp":1657333233000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9405188\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,3]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/irps46558.2021.9405188","relation":{},"subject":[],"published":{"date-parts":[[2021,3]]}}}