{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:07:09Z","timestamp":1740100029981,"version":"3.37.3"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001700","name":"MEXT","doi-asserted-by":"publisher","award":["17H06148"],"award-info":[{"award-number":["17H06148"]}],"id":[{"id":"10.13039\/501100001700","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,3]]},"DOI":"10.1109\/irps46558.2021.9405189","type":"proceedings-article","created":{"date-parts":[[2021,4,26]],"date-time":"2021-04-26T22:48:05Z","timestamp":1619477285000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Characterization of Slow Traps in SiGe MOS Interfaces by TiN\/Y2O3 Gate Stacks"],"prefix":"10.1109","author":[{"given":"T.-E.","family":"Lee","sequence":"first","affiliation":[]},{"given":"K.","family":"Toprasertpong","sequence":"additional","affiliation":[]},{"given":"M.","family":"Takenaka","sequence":"additional","affiliation":[]},{"given":"S.","family":"Takagi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2019.05.005"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.5144198"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3014563"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.4958890"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614529"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1021\/acsaelm.8b00071"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.tsf.2011.10.103"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.56.7304"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.5b06087"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.4974291"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1149\/1.3487530"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.1404409"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.6b03331"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1149\/06604.0017ecst"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2016.7573369"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993522"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2007.02.017"},{"journal-title":"International Roadmap for Devices and Systems 2020 Edition","year":"0","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIT.2019.8776523"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2015.04.081"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.19.2143"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1063\/1.331695"}],"event":{"name":"2021 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2021,3,21]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2021,3,25]]}},"container-title":["2021 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9405068\/9405088\/09405189.pdf?arnumber=9405189","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:19:30Z","timestamp":1657333170000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9405189\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,3]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/irps46558.2021.9405189","relation":{},"subject":[],"published":{"date-parts":[[2021,3]]}}}