{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,21]],"date-time":"2026-04-21T05:17:13Z","timestamp":1776748633198,"version":"3.51.2"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,3]]},"DOI":"10.1109\/irps46558.2021.9405190","type":"proceedings-article","created":{"date-parts":[[2021,4,26]],"date-time":"2021-04-26T22:48:05Z","timestamp":1619477285000},"page":"1-7","source":"Crossref","is-referenced-by-count":4,"title":["Evaluation methodology for assessment of dielectric degradation and breakdown dynamics using time-dependent impedance spectroscopy (TDIS)"],"prefix":"10.1109","author":[{"given":"Tomohiro","family":"Kuyama","sequence":"first","affiliation":[]},{"given":"Keiichiro","family":"Urabe","sequence":"additional","affiliation":[]},{"given":"Koji","family":"Eriguchi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.5050181"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jallcom.2020.157356"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/16.535341"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1999.824190"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.845236"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2933615"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.7567\/JJAP.56.06HD03"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.7567\/JJAP.57.06JD03"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9781139195065"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/9781119381860.ch2"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2003.12.007"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.49.10278"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2016.7574512"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6531969"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1021\/acs.jpclett.7b00415"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2933612"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1993.347339"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1985.21957"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/9781119381860.ch1"},{"key":"ref20","author":"nicollian","year":"1982","journal-title":"MOS (Metal Oxide Semiconductor) Physics and Technology"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1002\/9781119381860.ch4"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1039\/b901906e"}],"event":{"name":"2021 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2021,3,21]]},"end":{"date-parts":[[2021,3,25]]}},"container-title":["2021 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9405068\/9405088\/09405190.pdf?arnumber=9405190","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:20:32Z","timestamp":1657333232000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9405190\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,3]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/irps46558.2021.9405190","relation":{},"subject":[],"published":{"date-parts":[[2021,3]]}}}