{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,22]],"date-time":"2026-04-22T06:10:28Z","timestamp":1776838228629,"version":"3.51.2"},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,3]]},"DOI":"10.1109\/irps46558.2021.9405193","type":"proceedings-article","created":{"date-parts":[[2021,4,26]],"date-time":"2021-04-26T22:48:05Z","timestamp":1619477285000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Product Lifetime Estimation in 7nm with Large data of Failure Rate and Si-Based Thermal Coupling Model"],"prefix":"10.1109","author":[{"given":"Jae-Gyung","family":"Ahn","sequence":"first","affiliation":[{"name":"Central Engineering Group, Xilinx, Inc.,San Jose,CA,USA,95124"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rhesa","family":"Nathanael","sequence":"additional","affiliation":[{"name":"Central Engineering Group, Xilinx, Inc.,San Jose,CA,USA,95124"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"I-Ru","family":"Chen","sequence":"additional","affiliation":[{"name":"Central Engineering Group, Xilinx, Inc.,San Jose,CA,USA,95124"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ping-Chin","family":"Yeh","sequence":"additional","affiliation":[{"name":"Central Engineering Group, Xilinx, Inc.,San Jose,CA,USA,95124"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jonathan","family":"Chang","sequence":"additional","affiliation":[{"name":"Central Engineering Group, Xilinx, Inc.,San Jose,CA,USA,95124"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2010.2093526"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS45951.2020.9128926"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ECTC.2015.7159743"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2019.8720594"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2017.8060060"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936278"}],"event":{"name":"2021 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2021,3,21]]},"end":{"date-parts":[[2021,3,25]]}},"container-title":["2021 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9405068\/9405088\/09405193.pdf?arnumber=9405193","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,2]],"date-time":"2022-08-02T23:46:01Z","timestamp":1659483961000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9405193\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,3]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/irps46558.2021.9405193","relation":{},"subject":[],"published":{"date-parts":[[2021,3]]}}}