{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,2]],"date-time":"2025-07-02T04:46:59Z","timestamp":1751431619571,"version":"3.37.3"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2020AAA0109001"],"award-info":[{"award-number":["2020AAA0109001"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,3]]},"DOI":"10.1109\/irps46558.2021.9405218","type":"proceedings-article","created":{"date-parts":[[2021,4,26]],"date-time":"2021-04-26T22:48:05Z","timestamp":1619477285000},"page":"1-5","source":"Crossref","is-referenced-by-count":2,"title":["Nanosecond-scale and self-heating free characterization of advanced CMOS transistors utilizing wave reflection"],"prefix":"10.1109","author":[{"given":"Wei","family":"Liu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yaru","family":"Ding","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Liang","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yi","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2019.8720587"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/APS.2005.1552267"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"237","DOI":"10.1080\/00207217.2018.1523473","article-title":"A new error reduction technique for reflection coefficient measurements for use in quick laboratory tests","volume":"106","author":"\u00e7olak","year":"0","journal-title":"International Journal of Electronics"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2019.2911085"},{"key":"ref4","first-page":"244","volume":"81","author":"stathis","year":"2018","journal-title":"Controversial issues in negative bias temperature instability Microelectronics Reliability"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2019.8720442"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353644"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2020.2992263"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2018.2861729"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIT.2017.7998153"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2020.2989413"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353540"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.5098786"}],"event":{"name":"2021 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2021,3,21]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2021,3,25]]}},"container-title":["2021 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9405068\/9405088\/09405218.pdf?arnumber=9405218","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:19:30Z","timestamp":1657333170000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9405218\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,3]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/irps46558.2021.9405218","relation":{},"subject":[],"published":{"date-parts":[[2021,3]]}}}