{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,14]],"date-time":"2026-02-14T10:25:50Z","timestamp":1771064750802,"version":"3.50.1"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,3]]},"DOI":"10.1109\/irps46558.2021.9405224","type":"proceedings-article","created":{"date-parts":[[2021,4,26]],"date-time":"2021-04-26T22:48:05Z","timestamp":1619477285000},"page":"1-6","source":"Crossref","is-referenced-by-count":10,"title":["Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique"],"prefix":"10.1109","author":[{"given":"Bikram Kishore","family":"Mahajan","sequence":"first","affiliation":[]},{"given":"Yen-Pu","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Dhanoop","family":"Varghese","sequence":"additional","affiliation":[]},{"given":"Vijay","family":"Reddy","sequence":"additional","affiliation":[]},{"given":"Srikanth","family":"Krishnan","sequence":"additional","affiliation":[]},{"given":"Muhammad Ashraful","family":"Alam","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2018.2792539"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1985.1052306"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2867650"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2017.07.043"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2122263"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2961090"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2859224"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.5048099"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(02)00027-6"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/16.405281"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISPSD.2005.1488016"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1969.16744"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(84)90070-4"},{"key":"ref8","year":"2016","journal-title":"Sentaurus Version L"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS45951.2020.9128965"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2941445"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2018.2833490"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2227321"}],"event":{"name":"2021 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2021,3,21]]},"end":{"date-parts":[[2021,3,25]]}},"container-title":["2021 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9405068\/9405088\/09405224.pdf?arnumber=9405224","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:19:37Z","timestamp":1657333177000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9405224\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,3]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/irps46558.2021.9405224","relation":{},"subject":[],"published":{"date-parts":[[2021,3]]}}}