{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:56:15Z","timestamp":1730271375220,"version":"3.28.0"},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/irps48203.2023.10117689","type":"proceedings-article","created":{"date-parts":[[2023,5,15]],"date-time":"2023-05-15T17:50:57Z","timestamp":1684173057000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Excellent Reliability performances of a truly 5V nBOXFET for Automotive and IOT applications"],"prefix":"10.1109","author":[{"given":"D.","family":"Lipp","sequence":"first","affiliation":[{"name":"GlobalFoundries,Dresden,Germany,01109"}]},{"given":"Z.","family":"Zhao","sequence":"additional","affiliation":[{"name":"GlobalFoundries,Dresden,Germany,01109"}]},{"given":"G.","family":"Krause","sequence":"additional","affiliation":[{"name":"GlobalFoundries,Dresden,Germany,01109"}]},{"given":"W.","family":"Arfaoui","sequence":"additional","affiliation":[{"name":"GlobalFoundries,Dresden,Germany,01109"}]},{"given":"E.","family":"Ebrard","sequence":"additional","affiliation":[{"name":"GlobalFoundries,Dresden,Germany,01109"}]},{"given":"G.","family":"Bossu","sequence":"additional","affiliation":[{"name":"GlobalFoundries,Dresden,Germany,01109"}]},{"given":"S.","family":"Evseev","sequence":"additional","affiliation":[{"name":"GlobalFoundries,Dresden,Germany,01109"}]},{"given":"M.","family":"Herklotz","sequence":"additional","affiliation":[{"name":"GlobalFoundries,Dresden,Germany,01109"}]},{"given":"M.","family":"Siddabathula","sequence":"additional","affiliation":[{"name":"GlobalFoundries,Dresden,Germany,01109"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ULIS.2015.7063767"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838029"},{"issue":"2244","key":"ref3","volume":"49","author":"Wu","year":"2002","journal-title":"IEEE Tran. Elec. Device"},{"issue":"087601","key":"ref4","volume":"92","author":"Sune","year":"2004","journal-title":"Phys. Rev. Lett."},{"issue":"1513","key":"ref5","volume":"84","author":"McPherson","year":"1998","journal-title":"Journal of Applied Physics"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.1998"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2012.2189931"}],"event":{"name":"2023 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2023,3,26]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2023,3,30]]}},"container-title":["2023 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10117589\/10117581\/10117689.pdf?arnumber=10117689","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T02:21:33Z","timestamp":1705026093000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10117689\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/irps48203.2023.10117689","relation":{},"subject":[],"published":{"date-parts":[[2023,3]]}}}