{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T16:25:06Z","timestamp":1781281506646,"version":"3.54.1"},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/irps48203.2023.10117702","type":"proceedings-article","created":{"date-parts":[[2023,5,15]],"date-time":"2023-05-15T13:50:57Z","timestamp":1684158657000},"page":"1-4","source":"Crossref","is-referenced-by-count":10,"title":["Lifetime Modeling of the 4H-SiC MOS Interface in the HTRB Condition Under the Influence of Screw Dislocations"],"prefix":"10.1109","author":[{"given":"E.","family":"Van Brunt","sequence":"first","affiliation":[{"name":"Wolfspeed, Inc.,Durham,NC,USA,4600"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"D. J.","family":"Lichtenwalner","sequence":"additional","affiliation":[{"name":"Wolfspeed, Inc.,Durham,NC,USA,4600"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"J. H.","family":"Park","sequence":"additional","affiliation":[{"name":"Wolfspeed, Inc.,Durham,NC,USA,4600"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"S.","family":"Ganguly","sequence":"additional","affiliation":[{"name":"Wolfspeed, Inc.,Durham,NC,USA,4600"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"J. W.","family":"McPherson","sequence":"additional","affiliation":[{"name":"Wolfspeed, Inc.,Durham,NC,USA,4600"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref7","doi-asserted-by":"crossref","first-page":"393","DOI":"10.4028\/www.scientific.net\/MSF.858.393","volume":"858","author":"sumakeris","year":"2016","journal-title":"Mat Sci Forum"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"433","DOI":"10.4028\/www.scientific.net\/MSF.1004.433","volume":"1004","author":"fiorenza","year":"0","journal-title":"Mat Sci Forum"},{"key":"ref3","first-page":"1","author":"neyer","year":"2021","journal-title":"Proc IRPS"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/16.8802"},{"key":"ref5","first-page":"5351","volume":"88","author":"mcpherson","year":"2000","journal-title":"JAP"},{"key":"ref2","first-page":"163","volume":"17","author":"watanabe","year":"2017","journal-title":"IEEE TED"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"137","DOI":"10.4028\/www.scientific.net\/MSF.924.137","volume":"924","author":"van brunt","year":"0","journal-title":"Mat Sci Forum"}],"event":{"name":"2023 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2023,3,26]]},"end":{"date-parts":[[2023,3,30]]}},"container-title":["2023 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10117589\/10117581\/10117702.pdf?arnumber=10117702","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T13:50:24Z","timestamp":1686577824000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10117702\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/irps48203.2023.10117702","relation":{},"subject":[],"published":{"date-parts":[[2023,3]]}}}