{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,24]],"date-time":"2025-08-24T01:16:23Z","timestamp":1755998183783},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/irps48203.2023.10117807","type":"proceedings-article","created":{"date-parts":[[2023,5,15]],"date-time":"2023-05-15T17:50:57Z","timestamp":1684173057000},"page":"1-5","source":"Crossref","is-referenced-by-count":4,"title":["Thermal and statistical analysis of various AlN\/GaN HEMT geometries for millimeter Wave applications"],"prefix":"10.1109","author":[{"given":"N.","family":"Said","sequence":"first","affiliation":[{"name":"IMS,Material to System Integration laboratory,Talence,France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Harrouche","sequence":"additional","affiliation":[{"name":"Institute of Electronics, Microelectronics and Nanotechnology, IEMN -CNRS,Lille,France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Medjdoub","sequence":"additional","affiliation":[{"name":"Institute of Electronics, Microelectronics and Nanotechnology, IEMN -CNRS,Lille,France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"Labat","sequence":"additional","affiliation":[{"name":"IMS,Material to System Integration laboratory,Talence,France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.G.","family":"Tartarin","sequence":"additional","affiliation":[{"name":"LAAS-CNRS,Systems Analysis and Architecture Laboratory,Toulouse,France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"Malbert","sequence":"additional","affiliation":[{"name":"IMS,Material to System Integration laboratory,Talence,France"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2019.2952314"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2011.2138674"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.35848\/1882-0786\/ac9c46"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2268160"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2421311"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2008.923318"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2020.113895"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.904476"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2019.06.050"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2006.346935"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2002.1021567"}],"event":{"name":"2023 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2023,3,26]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2023,3,30]]}},"container-title":["2023 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10117589\/10117581\/10117807.pdf?arnumber=10117807","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T17:50:07Z","timestamp":1686592207000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10117807\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/irps48203.2023.10117807","relation":{},"subject":[],"published":{"date-parts":[[2023,3]]}}}