{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T16:32:42Z","timestamp":1781281962938,"version":"3.54.1"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/irps48203.2023.10117818","type":"proceedings-article","created":{"date-parts":[[2023,5,15]],"date-time":"2023-05-15T17:50:57Z","timestamp":1684173057000},"page":"1-7","source":"Crossref","is-referenced-by-count":6,"title":["Modeling of NBTI Induced Threshold Voltage Shift Based on Activation Energy Maps Under Consideration of Variability"],"prefix":"10.1109","author":[{"given":"Christian","family":"Bogner","sequence":"first","affiliation":[{"name":"Institute for Microelectronics, TU Vienna"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Christian","family":"Schlunder","sequence":"additional","affiliation":[{"name":"Infineon Technologies AG,Munich"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Michael","family":"Waltl","sequence":"additional","affiliation":[{"name":"Institute for Microelectronics, TU Vienna"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hans","family":"Reisinger","sequence":"additional","affiliation":[{"name":"Infineon Technologies AG,Munich"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tibor","family":"Grasser","sequence":"additional","affiliation":[{"name":"Institute for Microelectronics, TU Vienna"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784452"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2015.7112702"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/0021-9991(76)90041-3"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131623"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2264816"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2353578"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IIRW.2015.7437060"},{"key":"ref22","author":"gillespie","year":"1991","journal-title":"Markov Processes An Introduction for Physical Scientists"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488856"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2020.113746"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6861195"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241841"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488857"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131624"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784604"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2480704"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251260"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2008.4558858"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48227.2022.9764496"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2941889"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2870170"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.09.002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784542"}],"event":{"name":"2023 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2023,3,26]]},"end":{"date-parts":[[2023,3,30]]}},"container-title":["2023 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10117589\/10117581\/10117818.pdf?arnumber=10117818","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T17:50:03Z","timestamp":1686592203000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10117818\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/irps48203.2023.10117818","relation":{},"subject":[],"published":{"date-parts":[[2023,3]]}}}