{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,8]],"date-time":"2026-04-08T20:48:52Z","timestamp":1775681332826,"version":"3.50.1"},"reference-count":47,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/irps48203.2023.10117874","type":"proceedings-article","created":{"date-parts":[[2023,5,15]],"date-time":"2023-05-15T13:50:57Z","timestamp":1684158657000},"page":"1-10","source":"Crossref","is-referenced-by-count":5,"title":["Impact of Phase-Change Memory Drift on Energy Efficiency and Accuracy of Analog Compute-in-Memory Deep Learning Inference (Invited)"],"prefix":"10.1109","author":[{"given":"Martin M.","family":"Frank","sequence":"first","affiliation":[{"name":"IBM T. J. Watson Research Center,NY,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ning","family":"Li","sequence":"additional","affiliation":[{"name":"IBM T. J. Watson Research Center,NY,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Malte J.","family":"Rasch","sequence":"additional","affiliation":[{"name":"IBM T. J. Watson Research Center,NY,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shubham","family":"Jain","sequence":"additional","affiliation":[{"name":"IBM T. J. Watson Research Center,NY,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ching-Tzu","family":"Chen","sequence":"additional","affiliation":[{"name":"IBM T. J. Watson Research Center,NY,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ramachandran","family":"Muralidhar","sequence":"additional","affiliation":[{"name":"IBM T. J. Watson Research Center,NY,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jin-Ping","family":"Han","sequence":"additional","affiliation":[{"name":"IBM T. J. Watson Research Center,NY,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vijay","family":"Narayanan","sequence":"additional","affiliation":[{"name":"IBM T. J. Watson Research Center,NY,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Timothy M.","family":"Philip","sequence":"additional","affiliation":[{"name":"IBM Research - Albany,Albany,NY,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kevin","family":"Brew","sequence":"additional","affiliation":[{"name":"IBM Research - Albany,Albany,NY,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andrew","family":"Simon","sequence":"additional","affiliation":[{"name":"IBM Research - Albany,Albany,NY,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Iqbal","family":"Saraf","sequence":"additional","affiliation":[{"name":"IBM Research - Albany,Albany,NY,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nicole","family":"Saulnier","sequence":"additional","affiliation":[{"name":"IBM Research - Albany,Albany,NY,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Irem","family":"Boybat","sequence":"additional","affiliation":[{"name":"IBM Research - Zurich,Rüschlikon,Switzerland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stanis\u0141aw","family":"Wo\u017aniak","sequence":"additional","affiliation":[{"name":"IBM Research - Zurich,Rüschlikon,Switzerland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Abu","family":"Sebastian","sequence":"additional","affiliation":[{"name":"IBM Research - Zurich,Rüschlikon,Switzerland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pritish","family":"Narayanan","sequence":"additional","affiliation":[{"name":"IBM Research - Almaden,San Jose,CA,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Charles","family":"Mackin","sequence":"additional","affiliation":[{"name":"IBM Research - Almaden,San Jose,CA,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"An","family":"Chen","sequence":"additional","affiliation":[{"name":"IBM Research - Almaden,San Jose,CA,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hsinyu","family":"Tsai","sequence":"additional","affiliation":[{"name":"IBM Research - Almaden,San Jose,CA,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Geoffrey W.","family":"Burr","sequence":"additional","affiliation":[{"name":"IBM Research - Almaden,San Jose,CA,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3140414"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.202201190"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.23919\/VLSICircuits52068.2021.9492362"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1557\/s43577-022-00391-6"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731715"},{"key":"ref37","year":"0","journal-title":"IBM Analog Hardware Acceleration Kit"},{"key":"ref14","first-page":"180","article-title":"A 40-nm, 2M-cell, 8b-precision, hybrid SLC-MLC PCM computing-in-memory macro with 20. 5-65. 0TOPS\/W for tiny-AI edge devices","author":"khwa","year":"2022","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC)"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/AICAS51828.2021.9458494"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-022-31405-1"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-16108-9"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3115993"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614558"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2439635"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353636"},{"key":"ref2","first-page":"144","article-title":"A 7nm 4-Core AI chip with 25. 6TFLOPS hybrid FP8 training, 102. 4TOPS INT4 inference and workload-aware throttling","author":"agrawal","year":"2021","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-01766-7"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1126\/science.aaw5581"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2865352"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM45625.2022.10019569"},{"key":"ref38","author":"rasch","year":"0","journal-title":"Hardware-aware training for large-scale and diverse deep learning inference workloads using in-memory computing-based accelerators"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM13553.2020.9372124"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993463"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/ab7794"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.21437\/Interspeech.2020-2442"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2746342"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM13553.2020.9371990"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202100179"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2016397"},{"key":"ref47","year":"2022","journal-title":"MLCommons"},{"key":"ref20","article-title":"Analog in-memory computing in FeFET-based 1 TIR array for edge AI applications","author":"saito","year":"2021","journal-title":"Proc Symp VLSI Technol"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-018-0180-5"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.18653\/v1\/W18-5446"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2016.2547718"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.3389\/fncom.2021.675741"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIT.2019.8776500"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2022.3221390"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.202106547"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS46558.2021.9405191"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993482"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM45625.2022.10019367"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.23919\/DATE48585.2020.9116401"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-021-04196-6"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/s41565-020-0655-z"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.eng.2020.01.007"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731754"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2019.2922889"},{"key":"ref40","article-title":"BERT: Pre-training of deep bidirectional transformers for language understanding","author":"devlin","year":"2018","journal-title":"ArXiv"}],"event":{"name":"2023 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2023,3,26]]},"end":{"date-parts":[[2023,3,30]]}},"container-title":["2023 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10117589\/10117581\/10117874.pdf?arnumber=10117874","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,8]],"date-time":"2026-04-08T20:00:04Z","timestamp":1775678404000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10117874\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":47,"URL":"https:\/\/doi.org\/10.1109\/irps48203.2023.10117874","relation":{},"subject":[],"published":{"date-parts":[[2023,3]]}}}