{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,25]],"date-time":"2026-03-25T19:22:52Z","timestamp":1774466572817,"version":"3.50.1"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/irps48203.2023.10117917","type":"proceedings-article","created":{"date-parts":[[2023,5,15]],"date-time":"2023-05-15T17:50:57Z","timestamp":1684173057000},"page":"1-7","source":"Crossref","is-referenced-by-count":6,"title":["MTJ degradation in multi-pillar SOT-MRAM with selective writing"],"prefix":"10.1109","author":[{"given":"Simon","family":"Van Beek","sequence":"first","affiliation":[{"name":"imec,Leuven,Belgium,3001"}]},{"given":"Kaiming","family":"Cai","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,3001"}]},{"given":"Kaiquan","family":"Fan","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,3001"}]},{"given":"Giacomo","family":"Talmelli","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,3001"}]},{"given":"Anna","family":"Trovato","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,3001"}]},{"given":"Nico","family":"Jossart","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,3001"}]},{"given":"Siddharth","family":"Rao","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,3001"}]},{"given":"Adrian","family":"Chasin","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,3001"}]},{"given":"Sebastien","family":"Couet","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,3001"}]}],"member":"263","reference":[{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevApplied.15.064015"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353555"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48227.2022.9764459"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSITechnologyandCir46769.2022.9830307"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2018.8502269"},{"key":"ref5","first-page":"1","article-title":"Beol compatible high retention perpendicular sot-mram device for sram replacement and machine learning","author":"couet","year":"2021","journal-title":"2021 Symposium on VLSI Tech-nology"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"57206","DOI":"10.1103\/PhysRevLett.100.057206","article-title":"Single-shot time-resolved measurements of nanosecond-scale spin-transfer induced switching: Stochastic versus deterministic aspects","volume":"100","author":"devolder","year":"2008","journal-title":"Phys Rev Lett"},{"key":"ref1","first-page":"1","article-title":"Edge-induced reliability amp; performance degradation in stt-mram: an etch engineering solution","author":"van beek","year":"2021","journal-title":"2021 IEEE International Reliability Physics Symposium (IRPS)"}],"event":{"name":"2023 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2023,3,26]]},"end":{"date-parts":[[2023,3,30]]}},"container-title":["2023 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10117589\/10117581\/10117917.pdf?arnumber=10117917","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T17:50:02Z","timestamp":1686592202000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10117917\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/irps48203.2023.10117917","relation":{},"subject":[],"published":{"date-parts":[[2023,3]]}}}