{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:36:26Z","timestamp":1740101786138,"version":"3.37.3"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004955","name":"Austrian Research Promotion Agency (FFG)","doi-asserted-by":"publisher","award":["826392"],"award-info":[{"award-number":["826392"]}],"id":[{"id":"10.13039\/501100004955","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/irps48203.2023.10117943","type":"proceedings-article","created":{"date-parts":[[2023,5,15]],"date-time":"2023-05-15T17:50:57Z","timestamp":1684173057000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests"],"prefix":"10.1109","author":[{"given":"D.","family":"Wieland","sequence":"first","affiliation":[{"name":"Infineon Technologies Austria AG,Villach,Austria,9500"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Ofner","sequence":"additional","affiliation":[{"name":"Kompetenzzentrum Automobil- und Industrieelektronik (KAI),Villach,Austria,9524"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Stabentheiner","sequence":"additional","affiliation":[{"name":"Infineon Technologies Austria AG,Villach,Austria,9500"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"B.","family":"Butej","sequence":"additional","affiliation":[{"name":"Kompetenzzentrum Automobil- und Industrieelektronik (KAI),Villach,Austria,9524"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Koller","sequence":"additional","affiliation":[{"name":"Kompetenzzentrum Automobil- und Industrieelektronik (KAI),Villach,Austria,9524"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Sun","sequence":"additional","affiliation":[{"name":"Infineon Technologies Americas Corp,El Segundo,CA,United States of America,90245"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Minetto","sequence":"additional","affiliation":[{"name":"Infineon Technologies Austria AG,Villach,Austria,9500"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Reiser","sequence":"additional","affiliation":[{"name":"Infineon Technologies Germany AG,Neubiberg,Germany,85579"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"O.","family":"H\u00e4berlen","sequence":"additional","affiliation":[{"name":"Infineon Technologies Austria AG,Villach,Austria,9500"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Nelhiebel","sequence":"additional","affiliation":[{"name":"Kompetenzzentrum Automobil- und Industrieelektronik (KAI),Villach,Austria,9524"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Glavanovics","sequence":"additional","affiliation":[{"name":"Kompetenzzentrum Automobil- und Industrieelektronik (KAI),Villach,Austria,9524"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Pogany","sequence":"additional","affiliation":[{"name":"TU Wien,Vienna,Austria,1040"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Ostermaier","sequence":"additional","affiliation":[{"name":"Infineon Technologies Austria AG,Villach,Austria,9500"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISPSD49238.2022.9813649"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2021.3090341"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353594"},{"journal-title":"JEDEC JEP 180 Guideline for Switching Reliability Evaluation Procedures for Gallium Nitride Power Conversion Devices","year":"2020","key":"ref14"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936308"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2919491"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.23919\/ISPSD.2017.7988916"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2019.113454"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.908601"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48227.2022.9764414"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2022.3170293"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISPSD.2016.7520768"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1985.1052311"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/16.310111"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(95)00404-1"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/1.1633018"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2020.113830"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CSICS.2011.6062461"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS46558.2021.9405142"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/16.485531"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3009603"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2719599"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/WiPDA46397.2019.8998919"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2665163"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISPSD.2014.6856029"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353593"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2017.06.046"}],"event":{"name":"2023 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2023,3,26]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2023,3,30]]}},"container-title":["2023 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10117589\/10117581\/10117943.pdf?arnumber=10117943","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T17:49:25Z","timestamp":1686592165000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10117943\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/irps48203.2023.10117943","relation":{},"subject":[],"published":{"date-parts":[[2023,3]]}}}