{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:56:31Z","timestamp":1730271391233,"version":"3.28.0"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/irps48203.2023.10117980","type":"proceedings-article","created":{"date-parts":[[2023,5,15]],"date-time":"2023-05-15T17:50:57Z","timestamp":1684173057000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["The Effects of Process Variations and BTI in Packaged FinFET Devices"],"prefix":"10.1109","author":[{"given":"E.","family":"Bender","sequence":"first","affiliation":[{"name":"Ariel University,Department of Electrical and Electronic Engineering,Ariel,Israel,40700"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J. B.","family":"Bernstein","sequence":"additional","affiliation":[{"name":"Ariel University,Department of Electrical and Electronic Engineering,Ariel,Israel,40700"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D. S.","family":"Boning","sequence":"additional","affiliation":[{"name":"Ariel University,Department of Electrical and Electronic Engineering,Ariel,Israel,40700"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Failure Mechanisms and Models for Semiconductor Devices","article-title":"JEDEC publication, JEP122G","year":"2010","key":"ref13"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1137\/0108008"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1115\/1.4010337"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2003.1269294"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.02.001"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.2197\/ipsjtsldm.11.2"},{"key":"ref11"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3390\/s21072285"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.07.115"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2006.320885"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.12.008"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2008.07.039"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48203.2023.10117881"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2005.852739"},{"key":"ref19","article-title":"Modeling and Analyzing NBTI in the Presence of PV","author":"siddiqua","year":"2011","journal-title":"12th ISQED"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/66.554480"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.12.004"},{"journal-title":"Technical Brief from Relex Software Corporation","article-title":"Calculating MTTF When You Have Zero Failures","year":"0","key":"ref7"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2016.09.005"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2011.03.101"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2013.07.044"},{"key":"ref6","article-title":"Failure Rate Estimation in the Case of Zero Failures","volume":"3216","author":"david","year":"0","journal-title":"SPIE"},{"key":"ref5","article-title":"Applied Reliability","author":"tobias","year":"1986","journal-title":"Van Nostrand Reinhold Company"}],"event":{"name":"2023 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2023,3,26]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2023,3,30]]}},"container-title":["2023 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10117589\/10117581\/10117980.pdf?arnumber=10117980","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T17:50:14Z","timestamp":1686592214000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10117980\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/irps48203.2023.10117980","relation":{},"subject":[],"published":{"date-parts":[[2023,3]]}}}