{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T11:08:22Z","timestamp":1762254502755},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/irps48203.2023.10118134","type":"proceedings-article","created":{"date-parts":[[2023,5,15]],"date-time":"2023-05-15T17:50:57Z","timestamp":1684173057000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons"],"prefix":"10.1109","author":[{"given":"Kazusa","family":"Takami","sequence":"first","affiliation":[{"name":"Kyoto University,Dept. Communications and Computer Engineering"}]},{"given":"Yuibi","family":"Gomi","sequence":"additional","affiliation":[{"name":"Kyoto University,Dept. Communications and Computer Engineering"}]},{"given":"Shin-Ichiro","family":"Abe","sequence":"additional","affiliation":[{"name":"Nuclear Science and Engineering Center, Japan Atomic Energy Agency"}]},{"given":"Wang","family":"Liao","sequence":"additional","affiliation":[{"name":"Photon Science Center, University of Tokyo"}]},{"given":"Seiya","family":"Manabe","sequence":"additional","affiliation":[{"name":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST)"}]},{"given":"Tetsuro","family":"Matsumoto","sequence":"additional","affiliation":[{"name":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST)"}]},{"given":"Masanori","family":"Hashimoto","sequence":"additional","affiliation":[{"name":"Kyoto University,Dept. Communications and Computer Engineering"}]}],"member":"263","reference":[{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2006.02.178"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0160390"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2008.11.086"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2003.1281368"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS45951.2020.9128951"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2021.3077266"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2021.3064666"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.13182\/NT11-A11550"},{"key":"ref5","article-title":"A Terrestrial SER Estimation Methodology with Simulation and Single-Source Irradiation Applicable to Diverse Neutron Sources","author":"abe","year":"2022","journal-title":"Proc of RADECS"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1021\/1\/012037"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2884908"},{"journal-title":"JEDEC Standard JESD89","article-title":"Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray Induced Soft Error in Semiconductor Devices","year":"2021","key":"ref1"}],"event":{"name":"2023 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2023,3,26]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2023,3,30]]}},"container-title":["2023 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10117589\/10117581\/10118134.pdf?arnumber=10118134","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T17:50:07Z","timestamp":1686592207000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10118134\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/irps48203.2023.10118134","relation":{},"subject":[],"published":{"date-parts":[[2023,3]]}}}