{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T16:12:14Z","timestamp":1777651934863,"version":"3.51.4"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U22B2043"],"award-info":[{"award-number":["U22B2043"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/irps48203.2023.10118190","type":"proceedings-article","created":{"date-parts":[[2023,5,15]],"date-time":"2023-05-15T17:50:57Z","timestamp":1684173057000},"page":"1-6","source":"Crossref","is-referenced-by-count":9,"title":["The Effects of $\\gamma$ Radiation-Induced Trapped Charges on Single Event Transient in DSOI Technology"],"prefix":"10.1109","author":[{"given":"Yuchong","family":"Wang","sequence":"first","affiliation":[{"name":"Institute of Microelectronics, Chinese Academy of Sciences University of Chinese Academy of Sciences,Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Siyuan","family":"Chen","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics, Chinese Academy of Sciences University of Chinese Academy of Sciences,Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fanyu","family":"Liu","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics, Chinese Academy of Sciences University of Chinese Academy of Sciences,Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bo","family":"Li","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics, Chinese Academy of Sciences University of Chinese Academy of Sciences,Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiangjiang","family":"Li","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics, Chinese Academy of Sciences University of Chinese Academy of Sciences,Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yang","family":"Huang","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics, Chinese Academy of Sciences University of Chinese Academy of Sciences,Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tiexin","family":"Zhang","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics, Chinese Academy of Sciences University of Chinese Academy of Sciences,Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xu","family":"Zhang","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics, Chinese Academy of Sciences University of Chinese Academy of Sciences,Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhengsheng","family":"Han","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics, Chinese Academy of Sciences University of Chinese Academy of Sciences,Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tianchun","family":"Ye","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics, Chinese Academy of Sciences University of Chinese Academy of Sciences,Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jing","family":"Wan","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology Fudan University,State key lab of ASIC and System,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2037419"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2020.3033880"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.895243"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/23.903753"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2038779"},{"key":"ref20","article-title":"Sentaurus User Guide","year":"0","journal-title":"Version H-2016 03"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2824402"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2869490"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2021.3094669"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2015.7112829"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2046752"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2614963"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(02)00027-6"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784597"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.839167"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2366244"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2005.860680"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/23.903751"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2022.3145027"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1984.4333477"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2034153"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/23.45444"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/23.25505"}],"event":{"name":"2023 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2023,3,26]]},"end":{"date-parts":[[2023,3,30]]}},"container-title":["2023 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10117589\/10117581\/10118190.pdf?arnumber=10118190","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T17:50:05Z","timestamp":1686592205000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10118190\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/irps48203.2023.10118190","relation":{},"subject":[],"published":{"date-parts":[[2023,3]]}}}