{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,18]],"date-time":"2025-12-18T14:22:33Z","timestamp":1766067753953},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/irps48203.2023.10118266","type":"proceedings-article","created":{"date-parts":[[2023,5,15]],"date-time":"2023-05-15T17:50:57Z","timestamp":1684173057000},"page":"1-7","source":"Crossref","is-referenced-by-count":4,"title":["Optimization of SCR for High-Speed Digital and RF Applications in 45-nm SOI CMOS Technology"],"prefix":"10.1109","author":[{"given":"Shudong","family":"Huang","sequence":"first","affiliation":[{"name":"University of Illinois at Urbana-Champaign,Department of Electrical and Computer Engineering,Urbana,IL,USA,61801"}]},{"given":"Srivatsan","family":"Parthasarathy","sequence":"additional","affiliation":[{"name":"Analog Devices, Inc.,Wilmington,MA,USA"}]},{"given":"Yuanzhong Paul","family":"Zhou","sequence":"additional","affiliation":[{"name":"Analog Devices, Inc.,Wilmington,MA,USA"}]},{"given":"Jean-Jacques","family":"Hajjar","sequence":"additional","affiliation":[{"name":"Analog Devices, Inc.,Wilmington,MA,USA"}]},{"given":"Elyse","family":"Rosenbaum","sequence":"additional","affiliation":[{"name":"University of Illinois at Urbana-Champaign,Department of Electrical and Computer Engineering,Urbana,IL,USA,61801"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/55.641428"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/SOI.2004.1391539"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2502951"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2081674"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6531947"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.846824"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2012.2231426"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT55466.2022.9963253"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.23919\/EOS\/ESD.2018.8509777"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2004.826529"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2016.7574555"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2003.1269334"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC54546.2022.9863162"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.2995145"}],"event":{"name":"2023 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2023,3,26]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2023,3,30]]}},"container-title":["2023 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10117589\/10117581\/10118266.pdf?arnumber=10118266","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T17:49:22Z","timestamp":1686592162000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10118266\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/irps48203.2023.10118266","relation":{},"subject":[],"published":{"date-parts":[[2023,3]]}}}