{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T13:51:24Z","timestamp":1774965084470,"version":"3.50.1"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T00:00:00Z","timestamp":1743292800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T00:00:00Z","timestamp":1743292800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,30]]},"DOI":"10.1109\/irps48204.2025.10982850","type":"proceedings-article","created":{"date-parts":[[2025,5,15]],"date-time":"2025-05-15T17:30:30Z","timestamp":1747330230000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Microprocessor Switching Activity Translation to AC Gate Oxide Wearout: Does it Matter? INTEL4 Meteor Lake Chip Activity Case Study"],"prefix":"10.1109","author":[{"given":"Luigi","family":"Pantisano","sequence":"first","affiliation":[{"name":"INTEL Technology Development,Hillsboro,OR,USA,97124"}]},{"given":"K.","family":"Joshi","sequence":"additional","affiliation":[{"name":"INTEL Technology Development,Hillsboro,OR,USA,97124"}]},{"given":"Z.","family":"Chbili","sequence":"additional","affiliation":[{"name":"INTEL Technology Development,Hillsboro,OR,USA,97124"}]},{"given":"E.","family":"Frantz","sequence":"additional","affiliation":[{"name":"INTEL Technology Development,Hillsboro,OR,USA,97124"}]},{"given":"S.M.","family":"Ramey","sequence":"additional","affiliation":[{"name":"INTEL Technology Development,Hillsboro,OR,USA,97124"}]},{"given":"J.","family":"Hicks","sequence":"additional","affiliation":[{"name":"INTEL Technology Development,Hillsboro,OR,USA,97124"}]},{"given":"H.","family":"Le","sequence":"additional","affiliation":[{"name":"INTEL Client Computing Group,Hillsboro,OR,USA,97124"}]},{"given":"K.M","family":"Foley","sequence":"additional","affiliation":[{"name":"INTEL Client Computing Group,Hillsboro,OR,USA,97124"}]},{"given":"K.","family":"Pasumarthi","sequence":"additional","affiliation":[{"name":"INTEL Client Computing Group,Hillsboro,OR,USA,97124"}]},{"given":"J.","family":"Sebot","sequence":"additional","affiliation":[{"name":"INTEL Client Computing Group,Hillsboro,OR,USA,97124"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/irps.2018.8353577"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6860597"},{"key":"ref3","volume-title":"IIRW Industry Panel: Vmax Scaling","author":"Hicks","year":"2023"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2019.2914362"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353576"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/iedm45741.2023.10413711"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48227.2022.9764512"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48203.2023.10117582"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VLSITechnologyandCir46769.2022.9830194"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2007.01.030"}],"event":{"name":"2025 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2025,3,30]]},"end":{"date-parts":[[2025,4,3]]}},"container-title":["2025 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10982526\/10982704\/10982850.pdf?arnumber=10982850","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,16]],"date-time":"2025-05-16T05:14:54Z","timestamp":1747372494000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10982850\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,30]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/irps48204.2025.10982850","relation":{},"subject":[],"published":{"date-parts":[[2025,3,30]]}}}