{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,16]],"date-time":"2025-05-16T05:40:06Z","timestamp":1747374006669,"version":"3.40.5"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T00:00:00Z","timestamp":1743292800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T00:00:00Z","timestamp":1743292800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,30]]},"DOI":"10.1109\/irps48204.2025.10983061","type":"proceedings-article","created":{"date-parts":[[2025,5,15]],"date-time":"2025-05-15T17:30:30Z","timestamp":1747330230000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Positive Bias Temperature Instability in Polysilicon\/SiO2 PMOS Transistors for Analog High Precision Applications"],"prefix":"10.1109","author":[{"given":"Dhanoop","family":"Varghese","sequence":"first","affiliation":[{"name":"Advanced Technology Development, Texas Instruments,Dallas,TX,75243"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vijaya","family":"Vemuri","sequence":"additional","affiliation":[{"name":"Advanced Technology Development, Texas Instruments,Dallas,TX,75243"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arif","family":"Sonnet","sequence":"additional","affiliation":[{"name":"Advanced Technology Development, Texas Instruments,Dallas,TX,75243"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vijay","family":"Reddy","sequence":"additional","affiliation":[{"name":"Advanced Technology Development, Texas Instruments,Dallas,TX,75243"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Srikanth","family":"Krishnan","sequence":"additional","affiliation":[{"name":"Advanced Technology Development, Texas Instruments,Dallas,TX,75243"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vivek","family":"Varier","sequence":"additional","affiliation":[{"name":"Analog Signal Chain, Texas Instruments,Tucson,AZ,85711"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cheuk","family":"Yu","sequence":"additional","affiliation":[{"name":"Analog Signal Chain, Texas Instruments,Tucson,AZ,85711"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Srinivas","family":"Pulijala","sequence":"additional","affiliation":[{"name":"Analog Signal Chain, Texas Instruments,Tucson,AZ,85711"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2004.840856"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2012.06.015"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IIRW.2011.6142576"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936401"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241939"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.06.024"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.10.012"},{"journal-title":"Technical White Paper, Texas Instruments","article-title":"Optimizing Chopper Amplifier Accuracy","author":"Kay","key":"ref8"},{"key":"ref9","article-title":"Methods and apparatus to improve performance of amplifiers","volume":"385","author":"Varier","year":"2022","journal-title":"United States Patent Application US17\/732"}],"event":{"name":"2025 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2025,3,30]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2025,4,3]]}},"container-title":["2025 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10982526\/10982704\/10983061.pdf?arnumber=10983061","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,16]],"date-time":"2025-05-16T05:14:53Z","timestamp":1747372493000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10983061\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,30]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/irps48204.2025.10983061","relation":{},"subject":[],"published":{"date-parts":[[2025,3,30]]}}}