{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,17]],"date-time":"2025-05-17T04:01:52Z","timestamp":1747454512189,"version":"3.40.5"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T00:00:00Z","timestamp":1743292800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T00:00:00Z","timestamp":1743292800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,30]]},"DOI":"10.1109\/irps48204.2025.10983331","type":"proceedings-article","created":{"date-parts":[[2025,5,15]],"date-time":"2025-05-15T17:30:30Z","timestamp":1747330230000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Evaluation of High Holding Voltage SCR Protection Capability in EOS and Overvoltage Regimes"],"prefix":"10.1109","author":[{"given":"Vladislav","family":"Vashchenko","sequence":"first","affiliation":[{"name":"Analog Devices Corp,San Jose,CA,USA,95134"}]},{"given":"Andrei","family":"Shibkov","sequence":"additional","affiliation":[{"name":"Angstrom Design Automation LLC,CA,USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.23919\/EOS\/ESD61719.2024.10702139"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.2992383"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/EOSESD.2015.7314780"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2941721"},{"key":"ref5","article-title":"Pseudo p-i-n avalanche diode clamp","volume-title":"EOS\/ESD Symposium","author":"Vashchenk","year":"2014"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/EOS\/ESD54763.2022.9928467"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.23919\/EOS\/ESD.2019.8870009"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-6565-3"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.23919\/EOS\/ESD61719.2024.10702114"},{"journal-title":"EOS-500 Electrical Overstress Pulse Generator","key":"ref10"},{"journal-title":"DECIMM\u2122 User Manual, Angstrom Design Automation","year":"2011","key":"ref11"},{"key":"ref12","article-title":"The relevance of long-duration TLP stress on system level ESD design","volume-title":"Electrical Overstress\/Electrostatic Discharge Symposium Proceedings","author":"Boselli","year":"2010"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2008.4558856"}],"event":{"name":"2025 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2025,3,30]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2025,4,3]]}},"container-title":["2025 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10982526\/10982704\/10983331.pdf?arnumber=10983331","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,16]],"date-time":"2025-05-16T05:30:06Z","timestamp":1747373406000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10983331\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,30]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/irps48204.2025.10983331","relation":{},"subject":[],"published":{"date-parts":[[2025,3,30]]}}}