{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,26]],"date-time":"2026-06-26T14:07:01Z","timestamp":1782482821411,"version":"3.54.5"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T00:00:00Z","timestamp":1743292800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T00:00:00Z","timestamp":1743292800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,30]]},"DOI":"10.1109\/irps48204.2025.10983375","type":"proceedings-article","created":{"date-parts":[[2025,5,15]],"date-time":"2025-05-15T17:30:30Z","timestamp":1747330230000},"page":"1-8","source":"Crossref","is-referenced-by-count":5,"title":["Novel Trigger Circuit & SCR Device Co-Engineering Based Local (I\/O-VSS & I\/O-VDD) ESD Clamp Concepts with Improved Latch-Up Susceptibility, Lower Leakage and Lower Capacitance for Ultra High Speed I\/Os"],"prefix":"10.1109","author":[{"given":"Mitesh","family":"Goyal","sequence":"first","affiliation":[{"name":"Indian Institute of Science,Department of ESE,Bangalore,India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mukesh","family":"Chaturvedi","sequence":"additional","affiliation":[{"name":"Samsung Semiconductor India Research,Design Enablement, Foundry Business Division,Bangalore,India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Harihar","family":"Nath","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of ESE,Bangalore,India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mahesh","family":"Vaidya","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of ESE,Bangalore,India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mayank","family":"Shrivastava","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of ESE,Bangalore,India"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/rfic.2003.1213959"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tdmr.2005.846824"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2003.809028"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2009.2021359"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/led.2012.2208934"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/soc.2003.1241496"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tdmr.2003.815192"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/55.915608"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/irps48228.2024.10529351"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/irps48228.2024.10529418"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tencon.2013.6718978"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/isqed51717.2021.9424350"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/icsict.2014.7021539"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2009.2019164"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VDAT.2011.5783551"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/eos\/esd.2019.8869982"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.1998.746288"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/irps.2019.8720580"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/irps.2013.6531947"},{"key":"ref20","author":"Werner","year":"2012","journal-title":"High Current TLP Characterisation: An Effective Tool for the Development of Semiconductor Devices and ESD Protection Solutions"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/icsict.2012.6467944"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/tdmr.2015.2466532"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2003.814434"}],"event":{"name":"2025 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2025,3,30]]},"end":{"date-parts":[[2025,4,3]]}},"container-title":["2025 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10982526\/10982704\/10983375.pdf?arnumber=10983375","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,16]],"date-time":"2025-05-16T05:32:31Z","timestamp":1747373551000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10983375\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,30]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/irps48204.2025.10983375","relation":{},"subject":[],"published":{"date-parts":[[2025,3,30]]}}}