{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,28]],"date-time":"2025-08-28T11:58:47Z","timestamp":1756382327276,"version":"3.40.5"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T00:00:00Z","timestamp":1743292800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T00:00:00Z","timestamp":1743292800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,30]]},"DOI":"10.1109\/irps48204.2025.10983478","type":"proceedings-article","created":{"date-parts":[[2025,5,15]],"date-time":"2025-05-15T17:30:30Z","timestamp":1747330230000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Comprehensive Reliability Assessment of WO<sub>x<\/sub> Engineering for Temperature-Resilient HfZrO<sub>2<\/sub> FeCAP"],"prefix":"10.1109","author":[{"given":"Eunjin","family":"Kim","sequence":"first","affiliation":[{"name":"School of Electronic and Electrical Engineering, Kyungpook National University,Daegu,South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hyoungjin","family":"Park","sequence":"additional","affiliation":[{"name":"School of Electronic and Electrical Engineering, Kyungpook National University,Daegu,South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiae","family":"Jeong","sequence":"additional","affiliation":[{"name":"School of Electronic and Electrical Engineering, Kyungpook National University,Daegu,South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Seokjae","family":"Lim","sequence":"additional","affiliation":[{"name":"School of Electronic and Electrical Engineering, Kyungpook National University,Daegu,South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiyong","family":"Woo","sequence":"additional","affiliation":[{"name":"School of Electronic and Electrical Engineering, Kyungpook National University,Daegu,South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48228.2024.10529299"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.202300171"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.202300798"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM50854.2024.10873595"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-024-80523-x"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/s22114087"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201600590"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1039\/c5tc01074h"}],"event":{"name":"2025 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2025,3,30]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2025,4,3]]}},"container-title":["2025 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10982526\/10982704\/10983478.pdf?arnumber=10983478","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,16]],"date-time":"2025-05-16T05:27:29Z","timestamp":1747373249000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10983478\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,30]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/irps48204.2025.10983478","relation":{},"subject":[],"published":{"date-parts":[[2025,3,30]]}}}