{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,16]],"date-time":"2025-05-16T06:10:09Z","timestamp":1747375809827,"version":"3.40.5"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T00:00:00Z","timestamp":1743292800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T00:00:00Z","timestamp":1743292800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,30]]},"DOI":"10.1109\/irps48204.2025.10983844","type":"proceedings-article","created":{"date-parts":[[2025,5,15]],"date-time":"2025-05-15T17:30:30Z","timestamp":1747330230000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Latch-Up Over-Current Protection Design with Power Restarted Function"],"prefix":"10.1109","author":[{"given":"Shih-Cheng","family":"Huang","sequence":"first","affiliation":[{"name":"National Yang Ming Chiao Tung University,Institute of Pioneer Semiconductor Innovation,Hsinchu,Taiwan"}]},{"given":"Ming-Dou","family":"Ker","sequence":"additional","affiliation":[{"name":"National Yang Ming Chiao Tung University,Institute of Electronics,Hsinchu,Taiwan"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1007\/978-1-4757-1887-4"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1002\/9780470516171"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1002\/9780470824092"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/16.387250"},{"volume-title":"JEDEC Solid State Technology Association, JESD78F.01 Standard","year":"2022","article-title":"IC Latch-Up Test","key":"ref5"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/jeds.2022.3231822"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/iscas.2004.1329936"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/icce-tw.2016.7520968"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/ihmsc.2013.116"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/temc.2022.3202806"}],"event":{"name":"2025 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2025,3,30]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2025,4,3]]}},"container-title":["2025 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10982526\/10982704\/10983844.pdf?arnumber=10983844","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,16]],"date-time":"2025-05-16T05:39:56Z","timestamp":1747373996000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10983844\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,30]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/irps48204.2025.10983844","relation":{},"subject":[],"published":{"date-parts":[[2025,3,30]]}}}