{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,17]],"date-time":"2025-05-17T04:02:00Z","timestamp":1747454520617,"version":"3.40.5"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T00:00:00Z","timestamp":1743292800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T00:00:00Z","timestamp":1743292800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000006","name":"U.S. Office of Naval Research","doi-asserted-by":"publisher","award":["N000142312479"],"award-info":[{"award-number":["N000142312479"]}],"id":[{"id":"10.13039\/100000006","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,30]]},"DOI":"10.1109\/irps48204.2025.10983862","type":"proceedings-article","created":{"date-parts":[[2025,5,15]],"date-time":"2025-05-15T17:30:30Z","timestamp":1747330230000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Comprehensive Analysis of Deep level Effects and in-situ Photoionization in 0.15 $\\mu \\mathrm{m}$ buffer-free AIGaN\/GaN HEMTs for RF applications"],"prefix":"10.1109","author":[{"given":"Francesco De","family":"Pieri","sequence":"first","affiliation":[{"name":"University of Padua,Department of Information Engineering,Padua,Italy,35131"}]},{"given":"Manuel","family":"Fregolent","sequence":"additional","affiliation":[{"name":"University of Padua,Department of Information Engineering,Padua,Italy,35131"}]},{"given":"Marco","family":"Saro","sequence":"additional","affiliation":[{"name":"University of Padua,Department of Information Engineering,Padua,Italy,35131"}]},{"given":"Andrea","family":"Carlotto","sequence":"additional","affiliation":[{"name":"University of Padua,Department of Information Engineering,Padua,Italy,35131"}]},{"given":"Mirco","family":"Boito","sequence":"additional","affiliation":[{"name":"University of Padua,Department of Information Engineering,Padua,Italy,35131"}]},{"given":"Carlo De","family":"Santi","sequence":"additional","affiliation":[{"name":"University of Padua,Department of Information Engineering,Padua,Italy,35131"}]},{"given":"Fabiana","family":"Rampazzo","sequence":"additional","affiliation":[{"name":"University of Padua,Department of Information Engineering,Padua,Italy,35131"}]},{"given":"Gaudenzio","family":"Meneghesso","sequence":"additional","affiliation":[{"name":"University of Padua,Department of Information Engineering,Padua,Italy,35131"}]},{"given":"Matteo","family":"Meneghini","sequence":"additional","affiliation":[{"name":"University of Padua,Department of Information Engineering,Padua,Italy,35131"}]},{"given":"Enrico","family":"Zanoni","sequence":"additional","affiliation":[{"name":"University of Padua,Department of Information Engineering,Padua,Italy,35131"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2023.3318564"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2013.2279021"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.5123374"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/led.2020.2988074"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/ad5b6c"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/inmmic57329.2023.10321773"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.35848\/1347-4065\/abdb82"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2023.3270134"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/iedm45625.2022.10019489"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2024.3473892"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/5.0085068"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.3479917"},{"key":"ref13","first-page":"11.4.1","article-title":"Schottky-on-heterojunction optoelectronic functional devices realized on AIGaN\/GaN-on-Si platform","volume":"2015","author":"Li","year":"2015","journal-title":"Tech. Dig. - Int. Electron Devices Meet. IEDM"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.4914455"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/led.2024.3523796"}],"event":{"name":"2025 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2025,3,30]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2025,4,3]]}},"container-title":["2025 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10982526\/10982704\/10983862.pdf?arnumber=10983862","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,16]],"date-time":"2025-05-16T05:41:17Z","timestamp":1747374077000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10983862\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,30]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/irps48204.2025.10983862","relation":{},"subject":[],"published":{"date-parts":[[2025,3,30]]}}}